In-Situ TEM Observation of Physical Degradation of AlGaN/GaN Devices under Applied Electric Field
2012 ◽
Vol 18
(S2)
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pp. 1872-1873
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
2019 ◽
Vol 75
(a2)
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pp. e271-e271
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2005 ◽
Vol 220
(2/3)
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Keyword(s):
2015 ◽
Vol 416
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pp. 169-174
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2004 ◽
Vol 268
(1-2)
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pp. 198-203
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