scholarly journals Using Electron Channeling Contrast Imaging for Misfit Dislocation Characterization in Heteroepitaxial III-V/Si Thin Films

2014 ◽  
Vol 20 (S3) ◽  
pp. 552-553
Author(s):  
Julia Deitz ◽  
Santino Carnevale ◽  
Marc De Graef ◽  
Yoosuf N. Picard ◽  
Stephen A. Ringel ◽  
...  
Keyword(s):  
Thin Films ◽  
Misfit Dislocation ◽  
Contrast Imaging ◽  
Electron Channeling

Rapid misfit dislocation characterization in heteroepitaxial III-V/Si thin films by electron channeling contrast imaging

2014 ◽  
Vol 104 (23) ◽  
pp. 232111 ◽  
Author(s):  
Santino D. Carnevale ◽  
Julia I. Deitz ◽  
John A. Carlin ◽  
Yoosuf N. Picard ◽  
Marc De Graef ◽  
...  
Keyword(s):  
Thin Films ◽  
Misfit Dislocation ◽  
Contrast Imaging ◽  
Electron Channeling

scholarly journals Quantitative misfit dislocation characterization with electron channeling contrast imaging

2021 ◽  
Vol 27 (S1) ◽  
pp. 912-914
Author(s):  
Ari Blumer ◽  
Marzieh Baan ◽  
Zak Blumer ◽  
Jacob Boyer ◽  
Tyler J. Grassman
Keyword(s):  
Misfit Dislocation ◽  
Contrast Imaging ◽  
Electron Channeling

scholarly journals Defect Analysis in La0.7Sr0.3MnO3 Epitaxial Thin Films by Electron Channeling Contrast Imaging (ECCI)

2014 ◽  
Vol 20 (S3) ◽  
pp. 1036-1037
Author(s):  
Miaolei Yan ◽  
Marc De Graef ◽  
Yoosuf N. Picard ◽  
Paul A. Salvador
Keyword(s):  
Thin Films ◽  
Epitaxial Thin Films ◽  
Defect Analysis ◽  
Contrast Imaging ◽  
Electron Channeling

Electron Channeling and Ion Channeling Contrast Imaging of Dislocations in Nitride Thin Films

2008 ◽  
Vol 14 (S2) ◽  
pp. 1194-1195 ◽  
Author(s):  
C Trager-Cowan ◽  
F Sweeney ◽  
PR Edwards ◽  
FL Dynowski ◽  
AJ Wilkinson ◽  
...  
Keyword(s):  
Thin Films ◽  
New Mexico ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
Ion Channeling

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Electron channeling contrast imaging of anti-phase boundaries in coherently strained La0.7Sr0.3MnO3 thin films on (110)-oriented SrTiO3

2015 ◽  
Vol 107 (4) ◽  
pp. 041601 ◽  
Author(s):  
Miaolei Yan ◽  
Marc De Graef ◽  
Yoosuf N. Picard ◽  
Paul A. Salvador
Keyword(s):  
Thin Films ◽  
Contrast Imaging ◽  
Phase Boundaries ◽  
Electron Channeling

Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films

2012 ◽  
Vol 18 (S2) ◽  
pp. 684-685 ◽  
Author(s):  
C. Trager-Cowan ◽  
G. Naresh-Kumar ◽  
B. Hourahine ◽  
P.R. Edwards ◽  
J. Bruckbauer ◽  
...  
Keyword(s):  
Thin Films ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
Semiconductor Thin Films ◽  
Nitride Semiconductor

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Characterization of Nitride Thin Films by Electron Backscatter Diffraction and Electron Channeling Contrast Imaging

2005 ◽  
Vol 892 ◽  
Author(s):  
Carol Trager-Cowan ◽  
Francis Sweeney ◽  
A J Wilkinson ◽  
P W Trimby ◽  
A. P. Day ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Backscatter Diffraction ◽  
Contrast Imaging ◽  
Electron Channeling ◽  
Electron Backscatter ◽  
Backscatter Diffraction
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