Applications of electron channeling contrast imaging for characterizing nitride semiconductor thin films
2012 ◽
Vol 18
(S2)
◽
pp. 684-685
◽
Keyword(s):
Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Keyword(s):
2008 ◽
Vol 14
(S2)
◽
pp. 1194-1195
◽
2012 ◽
Vol 209
(3)
◽
pp. 424-426
◽
Scanning Tunneling Luminescence Studies of Nitride Semiconductor Thin Films under Ambient Conditions
2001 ◽
Vol 228
(2)
◽
pp. 445-448