scholarly journals Atomic Force Microscopy of Polymer Systems: From Morphology to Properties to Chemical Imaging and Spectroscopy

2016 ◽  
Vol 22 (S3) ◽  
pp. 354-355 ◽  
Author(s):  
Gregory F. Meyers
Keyword(s):  
Atomic Force Microscopy ◽  
Chemical Imaging ◽  
Polymer Systems ◽  
Force Microscopy ◽  
Atomic Force ◽  
Imaging And Spectroscopy

scholarly journals Characterization of integrated waveguides by atomic-force-microscopy-assisted mid-infrared imaging and spectroscopy

2020 ◽  
Vol 28 (15) ◽  
pp. 22186
Author(s):  
Kevin Gallacher ◽  
Ross W. Millar ◽  
Douglas J. Paul ◽  
Jacopo Frigerio ◽  
Andrea Ballabio ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Infrared Imaging ◽  
Mid Infrared ◽  
Force Microscopy ◽  
Atomic Force ◽  
Imaging And Spectroscopy

Atomic Force Microscopy Studies of Fracture Surfaces From Oxide / Polymer Interfaces

2000 ◽  
Vol 654 ◽  
Author(s):  
Maura Jenkins ◽  
Jeffrey Snodgrass ◽  
Aaron Chesterman ◽  
Reinhold H. Dauskardt ◽  
John C. Bravman
Keyword(s):  
Atomic Force Microscopy ◽  
Photoelectron Spectroscopy ◽  
Silicon Oxide ◽  
Polymer Interfaces ◽  
Adhesion Promoter ◽  
Polymer Systems ◽  
X Ray ◽  
Force Microscopy ◽  
Fracture Surfaces ◽  
Atomic Force

AbstractAtomic Force Microscopy (AFM) is used to characterize fracture surfaces in silicon oxide / silane adhesion promoter / BCB polymer systems. Fatigue striations were found on some samples, and these were correlated with the crack growth rate per fatigue cycle. X-ray Photoelectron Spectroscopy (XPS) was used to identify the species present on each surface, and it was found that striations only form when the fracture path is through the polymer.

Stochastic Switching and Reduction of Integrity in Atomic Force Microscopy

2018 ◽  
Author(s):  
Pierpaolo Belardinelli ◽  
Stefano Lenci ◽  
Farbod Alijani
Keyword(s):  
Atomic Force Microscopy ◽  
Stable State ◽  
State Assessment ◽  
Force Microscopy ◽  
Regime Changes ◽  
Atomic Force ◽  
Stochastic Switching ◽  
Imaging And Spectroscopy ◽  
The Stability ◽  
Ultimate Condition

In the presence of more than one stable state, assessment of stability is crucial for a proper device characterization. This is of particular importance in atomic force microscopy due to rich dynamics exhibited by the oscillating microcantilever probe that interacts with a sample. Indeed, the multistability can evolve in dramatic regime changes. This work aims at investigating the stochastic switching in which perturbations are responsible for shifts between alternative states with consequences in imaging and spectroscopy. The deceptively straightforward identification of the stability highlights noise-activated escapes. The barrier crossing from metastable wells in the atomic force microscopy leading to problematic configurations are observed in a variety of different configurations with the stochastic resonance as ultimate condition. Our analysis sheds light on the effect of combined additive noise and external excitation. The noise-induced erosion of the attractive domain shows a progressive reduction of the dynamical integrity of amplitude modulation atomic force microscopes.

The Application of Atomic Force Microscopy to the Characterization of Industrial Polymer Materials

MRS Bulletin ◽  
2004 ◽  
Vol 29 (7) ◽  
pp. 464-470 ◽  
Author(s):  
Georg K. Bar ◽  
Gregory F. Meyers
Keyword(s):  
Atomic Force Microscopy ◽  
Polymeric Materials ◽  
Porous Polymer ◽  
Polymer Materials ◽  
Phase Imaging ◽  
Structure Property ◽  
Polymer Systems ◽  
Force Microscopy ◽  
Atomic Force

AbstractAtomic force microscopy (AFM) is now well established among the tools of choice for the analysis and characterization of materials.Applications of AFM span many industries including chemicals, plastics, pharmaceuticals, and semiconductors.Advancements in AFM instrumentation over the last five years have expanded the range of application of this technology to investigate thermal and mechanical properties of complex materials at high spatial resolution as well as structural and morphological characterization of materials subjected to thermal and mechanical stresses.In particular, this has been an enabling technology for an improved understanding of structure–property relationships in polymeric materials including homopolymers, blends, impact-modified polymer systems, porous polymer systems, and semicrystalline polymers.Practical examples illustrate applications of contact, tapping-mode, phase-imaging, hot-stage, and scanning thermal methods for the characterization of modern industrial polymer materials.

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