High-Efficiency Three-Dimensional Visualization of Complex Microstructures via Multidimensional STEM Acquisition and Reconstruction

2020 ◽  
Vol 26 (2) ◽  
pp. 240-246 ◽  
Author(s):  
Kevin G. Field ◽  
Benjamin P. Eftink ◽  
Chad M. Parish ◽  
Stuart A. Maloy
Keyword(s):  
High Efficiency ◽  
3D Visualization ◽  
Accurate Determination ◽  
Three Dimensional ◽  
High Energy ◽  
Scanning Transmission Electron Microscope ◽  
Chromium Steel ◽  
Transmission Electron ◽  
Scanning Transmission

AbstractComplex material systems in which microstructure and microchemistry are nonuniformly dispersed require three-dimensional (3D) rendering(s) to provide an accurate determination of the physio-chemical nature of the system. Current scanning transmission electron microscope (STEM)-based tomography techniques enable 3D visualization but can be time-consuming, so only select systems or regions are analyzed in this manner. Here, it is presented that through high-efficiency multidimensional STEM acquisition and reconstruction, complex point cloud-like microstructural features can quickly and effectively be reconstructed in 3D. The proposed set of techniques is demonstrated, analyzed, and verified for a high-chromium steel with heterogeneously situated features induced using high-energy neutron bombardment.

Fast Throughput Low Voltage Scanning Transmission Electron Microscope Imaging of Nano-Resolution Three Dimensional Tissue

2009 ◽  
Vol 15 (S2) ◽  
pp. 642-643
Author(s):  
M Bolorizadeh ◽  
HF Hess
Keyword(s):  
Electron Microscope ◽  
Transmission Electron Microscope ◽  
Low Voltage ◽  
Three Dimensional ◽  
Scanning Transmission Electron Microscope ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Microscope Imaging ◽  
Electron Microscope Imaging ◽  
Voltage Scanning

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Energy-Filtered CTEM Image of MgO Smoke Particles

1985 ◽  
Vol 43 ◽  
pp. 410-411
Author(s):  
Y. Kondo ◽  
T. Yoshioka ◽  
T. Oikawa ◽  
Y. Kokubo ◽  
M. Kersker
Keyword(s):  
Electron Microscope ◽  
Energy Resolution ◽  
Transmission Electron Microscope ◽  
High Energy ◽  
Scanning Transmission Electron Microscope ◽  
High Energy Resolution ◽  
Energy Analyzer ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Sector Type

The energy filtered imaging technique has so far been carried out in a scanning transmission electron microscope (STEM) fitted with a sector type energy analyzer. The STEM has a disadvantage of low beam parallelity because it uses a convergent beam, while the conventional transmission electron microscope (CTEM) allows good phase contrast and diffraction contrast to be obtained because of the high parallelity of the beam, and allows also high resolution images to be obtained. The technique to obtain energy filtered CTEM images has thus far been carried out by a Castaing-Henry type filter or an Ω type filter. However, these filters have the disadvantage of lower energy resolution than conventional sector type energy analyzer at the present time. This paper reports energy filtered CTEM images of MgO smoke, obtained using a new scanning CTEM image technique and a high energy resolution sector type energy analyzer which can resolve bulk and surface plasmon energy.

Rapid and Semi-automated Method for Analysis of the Number of Atoms of Ultra-small Platinum Clusters on Carbon

2000 ◽  
Vol 6 (4) ◽  
pp. 353-357
Author(s):  
J.C. Yang ◽  
S. Bradley ◽  
J.M. Gibson
Keyword(s):  
Three Dimensional ◽  
Scanning Transmission Electron Microscope ◽  
Dark Field ◽  
Spectroscopic Technique ◽  
Automated Method ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Annular Dark Field ◽  
Dimensional Shape ◽  
Three Dimensional Shape

Abstract Very high angle (~100 mrad) annular dark-field (HAADF) images in a dedicated scanning transmission electron microscope (STEM) can be used to quantitatively measure the number of atoms in a cluster on a support material. We have developed a computer program which will automatically find the location of the particles and then integrate the intensity to find the number of atoms per cluster. We have examined ultra-small Pt clusters on a C substrate by this novel mass-spectroscopic technique. We discovered that the Pt clusters maintain their three-dimensional shape, and are probably spherical.

A Novel Diode Detector in a Scanning Transmission Microscope

1972 ◽  
Vol 30 ◽  
pp. 442-443
Author(s):  
C. S. Kim ◽  
T. E. Everhart
Keyword(s):  
High Energy ◽  
Scanning Transmission Electron Microscope ◽  
Semiconductor Diode ◽  
Objective Lens ◽  
Contrast Effects ◽  
Thin Sample ◽  
Transmission Electron ◽  
High Energy Electrons ◽  
Scanning Transmission ◽  
Pass Through

High-resolution in a scanning transmission electron microscope can be obtained using a condenser-objective lens. A suitable semiconductor diode is an efficient detector of high-energy electrons; an annular detector allows unscattered primary electrons or inelastically scattered electrons to pass through the hole, while elastically scattered electrons strike the diode, and are detected.Electrons passing through a thin sample may be elastically scattered through angles of many tens of milliradians, inelastically scattered with angular deflections of ∼ 1 mr, or not scattered at all. The inelastically scattered electrons do not depart significantly from the unscattered beam. Since the beam convergence angle at the sample is typically a few milliradians, the elastically scattered electrons can be collected using a detector with a hole positioned at the beam axis to allow the inelastically scattered electrons and the unscattered electrons to pass through. These electrons can be separated with an electron spectrometer to provide important contrast effects.

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