Imaging and 3D Elemental Characterization of Intact Bacterial Spores by High-Resolution Secondary Ion Mass Spectrometry

Bacterial Spores ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Elemental Characterization

Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of Microbatteries

ACS Applied Materials & Interfaces ◽

10.1021/acsami.1c10352 ◽

2021 ◽

Vol 13 (34) ◽

pp. 41262-41274

Author(s):

Agnieszka Priebe ◽

Jordi Sastre ◽

Moritz H. Futscher ◽

Jakub Jurczyk ◽

Marcos V. Puydinger dos Santos ◽

...

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Elemental Characterization

Evaluation of Accelerator-based Secondary Ion Mass Spectrometry for the Ultra-trace Elemental Characterization of Bulk Silicon

Springer Series in Chemical Physics - Secondary Ion Mass Spectrometry SIMS V ◽

10.1007/978-3-642-82724-2_49 ◽

1986 ◽

pp. 192-194 ◽

Cited By ~ 2

Author(s):

R. J. Blattner ◽

J. C. Huneke ◽

M. D. Strathman ◽

R. S. Hockett ◽

W. E. Kieser ◽

...

Keyword(s):

Mass Spectrometry ◽

Bulk Silicon ◽

Ion Mass Spectrometry ◽

Trace Elemental ◽

Ultra Trace ◽

Secondary Ion ◽

Elemental Characterization

High resolution 3-D imaging for characteristics of (111)-oriented Pb(Zr0.35Ti0.65)O3 thin film by using time-of-flight secondary ion mass spectrometry and piezoresponse force microscopy

Electronic Materials Letters ◽

10.1007/s13391-011-0916-y ◽

2011 ◽

Vol 7 (3) ◽

pp. 265-270 ◽

Cited By ~ 5

Author(s):

Hyun-Chang Shin ◽

Joon-Tae Song

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

High Resolution ◽

Time Of Flight ◽

Piezoresponse Force Microscopy ◽

Force Microscopy ◽

Ion Mass Spectrometry ◽

Forensic Characterization of Lipsticks Using Time-of-Flight Secondary Ion Mass Spectrometry

Journal of Analytical Chemistry ◽

10.1134/s1061934821070091 ◽

2021 ◽

Vol 76 (7) ◽

pp. 854-867

Author(s):

Jihye Lee ◽

Yeonhee Lee

Keyword(s):

Mass Spectrometry ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Secondary ion mass spectrometry (SIMS) applications on characterization of RF NPN bipolar polysilicon emitter process

10.1063/1.52570 ◽

1997 ◽

Cited By ~ 2

Author(s):

S. Lu

Keyword(s):

Mass Spectrometry ◽

Ion Mass Spectrometry ◽

Polysilicon Emitter ◽

Characterization of sequentially grafted polysaccharide coatings using time-of-flight secondary ion mass spectrometry (ToF-SIMS) and principal component analysis (PCA)

Surface and Interface Analysis ◽

10.1002/sia.1446 ◽

2002 ◽

Vol 33 (12) ◽

pp. 924-931 ◽

Cited By ~ 13

Author(s):

Sally L. McArthur ◽

Matthew S. Wagner ◽

Patrick G. Hartley ◽

Keith M. McLean ◽

Hans J. Griesser ◽

...

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Characterization of S-glass/polysulfone adhesive failure using ion scattering spectroscopy and secondary ion mass spectrometry

Journal of Colloid and Interface Science ◽

10.1016/0021-9797(80)90178-2 ◽

1980 ◽

Vol 74 (1) ◽

pp. 150-162 ◽

Cited By ~ 26

Author(s):

Anthony T Dibenedetto ◽

Daniel A Scola

Keyword(s):

Mass Spectrometry ◽

Adhesive Failure ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

Characterization of the superlattice region of a quantum cascade laser by secondary ion mass spectrometry

Nanoscale ◽

10.1039/c7nr06401b ◽

2017 ◽

Vol 9 (44) ◽

pp. 17571-17575 ◽

Cited By ~ 8

Author(s):

Paweł Piotr Michałowski ◽

Piotr Gutowski ◽

Dorota Pierścińska ◽

Kamil Pierściński ◽

Maciej Bugajski ◽

...

Keyword(s):

Mass Spectrometry ◽

Quantum Cascade Laser ◽

Quantum Cascade ◽

Oxygen Contamination ◽

Ion Mass Spectrometry ◽

Non-uniform oxygen contamination in the superlattice region of a quantum cascade laser measured by secondary ion mass spectrometry.

Purification of Cu by hydrogen plasma-arc zone melting and characterization of trace impurities by secondary ion mass spectrometry

Materials Characterization ◽

10.1016/j.matchar.2008.05.004 ◽

2009 ◽

Vol 60 (1) ◽

pp. 60-64 ◽

Cited By ~ 5

Author(s):

G.M. Lalev ◽

J.-W. Lim ◽

N.R. Munirathnam ◽

G.-S. Choi ◽

M. Uchikoshi ◽

...

Keyword(s):

Mass Spectrometry ◽

Hydrogen Plasma ◽

Zone Melting ◽

Plasma Arc ◽

Trace Impurities ◽

Ion Mass Spectrometry ◽

Characterization of sharp phosphorus dopant features in silicon by secondary ion mass spectrometry

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.577286 ◽

1991 ◽

Vol 9 (4) ◽

pp. 2402-2404 ◽

Cited By ~ 2

Author(s):

C. J. Vriezema ◽

P. C. Zalm ◽

J. W. F. M. Maes ◽

P. J. Roksnoer

Keyword(s):

Mass Spectrometry ◽

Ion Mass Spectrometry ◽