Evaluation of Accelerator-based Secondary Ion Mass Spectrometry for the Ultra-trace Elemental Characterization of Bulk Silicon

1986 ◽  
pp. 192-194 ◽  
Author(s):  
R. J. Blattner ◽  
J. C. Huneke ◽  
M. D. Strathman ◽  
R. S. Hockett ◽  
W. E. Kieser ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Bulk Silicon ◽  
Ion Mass Spectrometry ◽  
Trace Elemental ◽  
Ultra Trace ◽  
Secondary Ion ◽  
Elemental Characterization

Imaging and 3D Elemental Characterization of Intact Bacterial Spores by High-Resolution Secondary Ion Mass Spectrometry

2008 ◽  
Vol 80 (15) ◽  
pp. 5986-5992 ◽  
Author(s):  
Sutapa Ghosal ◽  
Stewart J. Fallon ◽  
Terrance J. Leighton ◽  
Katherine E. Wheeler ◽  
Michael J. Kristo ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
High Resolution ◽  
Secondary Ion Mass Spectrometry ◽  
Bacterial Spores ◽  
Ion Mass Spectrometry ◽  
Secondary Ion ◽  
Elemental Characterization

Characterization of the superlattice region of a quantum cascade laser by secondary ion mass spectrometry

Nanoscale ◽  
2017 ◽  
Vol 9 (44) ◽  
pp. 17571-17575 ◽  
Author(s):  
Paweł Piotr Michałowski ◽  
Piotr Gutowski ◽  
Dorota Pierścińska ◽  
Kamil Pierściński ◽  
Maciej Bugajski ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Quantum Cascade Laser ◽  
Secondary Ion Mass Spectrometry ◽  
Quantum Cascade ◽  
Oxygen Contamination ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Non-uniform oxygen contamination in the superlattice region of a quantum cascade laser measured by secondary ion mass spectrometry.

scholarly journals Potential of gas-assisted time-of-flight secondary ion mass spectrometry for improving the elemental characterization of complex metal-based systems

2020 ◽  
Vol 35 (12) ◽  
pp. 2997-3006
Author(s):  
Agnieszka Priebe ◽  
Tianle Xie ◽  
Laszlo Pethö ◽  
Johann Michler
Keyword(s):  
Mass Spectrometry ◽  
Chemical Analysis ◽  
Secondary Ion Mass Spectrometry ◽  
High Sensitivity ◽  
Elemental Distribution ◽  
Tof Sims ◽  
Molecular Information ◽  
Secondary Ion ◽  
Elemental Characterization

Enhancing the spatial resolution of TOF-SIMS, which provides 3D elemental distribution in combination with high sensitivity and molecular information, is currently one of the hottest topics in the field of chemical analysis at the nanoscale.

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