Atomic-Scale Structural Analysis on the Interfaces between Molten Gallium and Solid Alloys by Atomic Force Microscopy

2021 ◽  
Author(s):  
Takashi Ichii ◽  
Makoto Murata ◽  
Toru Utsunomiya ◽  
Hiroyuki Sugimura
Keyword(s):  
Atomic Force Microscopy ◽  
Structural Analysis ◽  
Atomic Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
Solid Alloys

Variations in Atomic-Scale Step Edge Structures and Dynamics of Dissolving Calcite in Water Revealed by High-Speed Frequency Modulation Atomic Force Microscopy

2019 ◽  
Vol 123 (32) ◽  
pp. 19786-19793 ◽  
Author(s):  
Kazuki Miyata ◽  
Yuta Kawagoe ◽  
John Tracey ◽  
Keisuke Miyazawa ◽  
Adam S. Foster ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
High Speed ◽  
Step Edge ◽  
Atomic Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scale Step

Atomic Force Microscopy of Atomic-Scale Ledges and Etch Pits Formed During Dissolution of Quartz

Science ◽  
1991 ◽  
Vol 251 (4999) ◽  
pp. 1343-1346 ◽  
Author(s):  
A. J. GRATZ ◽  
S. MANNE ◽  
P. K. HANSMA
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Scale ◽  
Etch Pits ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Atomic-Scale Variations of the Mechanical Response of 2D Materials Detected by Noncontact Atomic Force Microscopy

2016 ◽  
Vol 116 (24) ◽  
Author(s):  
B. de la Torre ◽  
M. Ellner ◽  
P. Pou ◽  
N. Nicoara ◽  
Rubén Pérez ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Mechanical Response ◽  
2D Materials ◽  
Atomic Scale ◽  
Force Microscopy ◽  
Atomic Force

Nanoindentation studies of sublimed fullerene films using atomic force microscopy

1993 ◽  
Vol 8 (12) ◽  
pp. 3019-3022 ◽  
Author(s):  
Juai Ruan ◽  
Bharat Bhushan
Keyword(s):  
Atomic Force Microscopy ◽  
Transfer Film ◽  
Atomic Scale ◽  
Diamond Surface ◽  
Low Friction ◽  
Force Microscopy ◽  
Diamond Sample ◽  
Atomic Force ◽  
Molecular Scale ◽  
Deposited Films

Nanoindentation studies of sublimed fullerene films have been conducted using an atomic force microscope (AFM). Transfer of fullerene molecules from the as-deposited films to the AFM tip was observed during the indentation of AFM tip into some of the samples, whereas such a transfer was not observed for ion-bombarded films. The fullerene molecules transferred to the AFM tip were subsequently transported to a diamond surface when the diamond sample was scanned with the contaminated tip. This demonstrates the capability of material manipulation on a molecular scale using AFM. Atomic-scale friction of the fullerene films was measured to be low. Ability of fullerene films to form transfer film on the mating AFM tip surface may be partly responsible for low friction.

scholarly journals Structural Analysis of Ionic-liquid/Organic-monolayer Interface by Phase Modulation Atomic Force Microscopy Utilizing a Quartz Tuning Fork Sensor

2014 ◽  
Vol 82 (5) ◽  
pp. 380-384 ◽  
Author(s):  
Takashi ICHII ◽  
Masahiro NEGAMI ◽  
Motohiko FUJIMURA ◽  
Kuniaki MURASE ◽  
Hiroyuki SUGIMURA
Keyword(s):  
Atomic Force Microscopy ◽  
Ionic Liquid ◽  
Structural Analysis ◽  
Phase Modulation ◽  
Tuning Fork ◽  
Quartz Tuning Fork ◽  
Force Microscopy ◽  
Organic Monolayer ◽  
Atomic Force

Direct observations of mineral fluid reactions using atomic force microscopy: the specific example of calcite

2012 ◽  
Vol 76 (1) ◽  
pp. 227-253 ◽  
Author(s):  
E. Ruiz -Agudo ◽  
C. V. Putnis
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Scale ◽  
Physical Parameters ◽  
Extensive Literature ◽  
Mineral Surfaces ◽  
Kinetic Measurements ◽  
Force Microscopy ◽  
Crystal Dissolution ◽  
Direct Observations ◽  
Atomic Force

AbstractAtomic force microscopy (AFM) enables in situ observations of mineral fluid reactions to be made at a nanoscale. During the past 20 years, the direct observation of mineral surfaces at molecular resolution during dissolution and growth has made significant contributions toward improvements in our understanding of the dynamics of mineral fluid reactions at the atomic scale. Observations and kinetic measurements of dissolution and growth from AFM experiments give valuable evidence for crystal dissolution and growth mechanisms, either confirming existing models or revealing their limitations. Modifications to theories can be made in the light of experimental evidence generated by AFM. Significant changes in the kinetics and mechanisms of crystallization and dissolution processes occur when the chemical and physical parameters of solutions, including the presence of impurity molecules or background electrolytes, are altered. Calcite has received considerable attention in AFM studies due to its central role in geochemical and biomineralization processes. This review summarizes the extensive literature on the dissolution and growth of calcite that has been generated by AFM studies, including the influence of fluid characteristics such as supersaturation, solution stoichiometry, pH, temperature and the presence of impurities.

Chemical and Structural Analysis of Nitridated Sapphire

1997 ◽  
Vol 482 ◽  
Author(s):  
Y. Cho ◽  
S. Rouvimov ◽  
Y. Kim ◽  
Z. Liliental-Weber ◽  
E. R. Weber
Keyword(s):  
Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Structural Analysis ◽  
Photoelectron Spectroscopy ◽  
High Resolution Electron Microscopy ◽  
Cross Sectional ◽  
Force Microscopy ◽  
Sapphire Substrates ◽  
Atomic Force ◽  
Resolution Electron

AbstractThe incorporation of nitrogen into sapphire substrates during nitridation was studied by xray photoelectron spectroscopy (XPS). An increase in the intensity of nitrogen 1s peak in XPS was observed upon longer nitridation. The surface morphology of the substrates was characterized by atomic force microscopy (AFM). High resolution electron microscopy (HREM) was employed for structural analysis. The cross sectional TEM showed a thin layer of AlN buried between amorphous AlNxO1−x and sapphire. This is the first direct observation of AlN on sapphire. The TEM images show a deeper penetration depth of nitrogen into a longer nitridated sapphire.

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