Role of Electron Donation of TiO2 Gate Interface for Developing Solution-Processed High-Performance One-Volt Metal-Oxide Thin-Film Transistor Using Ion-Conducting Gate Dielectric
2019 ◽
Vol 123
(33)
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pp. 20278-20286
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2016 ◽
Vol 47
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pp. 1151-1154
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2019 ◽
Vol 16
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pp. 22-34
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2011 ◽
Vol 42
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pp. 483-485
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2013 ◽
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pp. 7166
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2020 ◽
Vol 35
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pp. 1211-1221
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