Operando Particle-Scale Characterization of Silicon Anode Degradation during Cycling by Ultrahigh-Resolution X-ray Microscopy and Computed Tomography

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Author(s):  
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Bharathy S. Parimalam ◽  
Laisuo Su ◽  
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...  

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Vol 22 (10) ◽  
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马小军 Ma Xiaojun ◽  
贾鹏 Jia Peng ◽  
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