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Operando Particle-Scale Characterization of Silicon Anode Degradation during Cycling by Ultrahigh-Resolution X-ray Microscopy and Computed Tomography
ACS Applied Energy Materials
◽
10.1021/acsaem.0c02823
◽
2021
◽
Vol 4
(2)
◽
pp. 1657-1665
Author(s):
Paul Choi
◽
Bharathy S. Parimalam
◽
Laisuo Su
◽
B. Reeja-Jayan
◽
Shawn Litster
Keyword(s):
Computed Tomography
◽
Silicon Anode
◽
Ultrahigh Resolution
◽
X Ray
◽
Scale Characterization
◽
Anode Degradation
Download Full-text
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Multi-modal characterization of collagen fibril orientation in human cortical bone by a combination of quantitative polarized Raman spectroscopy, nanoscale X-ray computed tomography and 360° electron tomography
Microscopy and Microanalysis
◽
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◽
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◽
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◽
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◽
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