Efficient Gate Modulation in a Screening-Engineered MoS2/Single-Walled Carbon Nanotube Network Heterojunction Vertical Field-Effect Transistor

2019 ◽  
Vol 11 (28) ◽  
pp. 25516-25523 ◽  
Author(s):  
Thanh Luan Phan ◽  
Quoc An Vu ◽  
Young Rae Kim ◽  
Yong Seon Shin ◽  
Il Min Lee ◽  
...  

2015 ◽  
Vol 2 (2) ◽  
pp. 1500222 ◽  
Author(s):  
Satria Zulkarnaen Bisri ◽  
Vladimir Derenskyi ◽  
Widianta Gomulya ◽  
Jorge Mario Salazar-Rios ◽  
Martin Fritsch ◽  
...  


2012 ◽  
Vol 2012 ◽  
pp. 1-7 ◽  
Author(s):  
Prasantha R. Mudimela ◽  
Kestutis Grigoras ◽  
Ilya V. Anoshkin ◽  
Aapo Varpula ◽  
Vladimir Ermolov ◽  
...  

Single-walled carbon nanotube network field effect transistors were fabricated and studied as humidity sensors. Sensing responses were altered by changing the gate voltage. At the open channel state (negative gate voltage), humidity pulse resulted in the decrease of the source-drain current, and,vice versa, the increase in the source-drain current was observed at the positive gate voltage. This effect was explained by the electron-donating nature of water molecules. The operation speed and signal intensity was found to be dependent on the gate voltage polarity. The positive or negative change in current with humidity pulse at zero-gate voltage was found to depend on the previous state of the gate electrode (positive or negative voltage, respectively). Those characteristics were explained by the charge traps in the gate dielectric altering the effective gate voltage, which influenced the operation of field effect transistor.



2021 ◽  
Vol 1147 ◽  
pp. 99-107
Author(s):  
QingYi Meng ◽  
Shuhua Wei ◽  
Zhiyuan Xu ◽  
Qiang Cao ◽  
Yushi Xiao ◽  
...  


Electronics ◽  
2019 ◽  
Vol 8 (2) ◽  
pp. 241 ◽  
Author(s):  
Huolin Huang ◽  
Feiyu Li ◽  
Zhonghao Sun ◽  
Nan Sun ◽  
Feng Zhang ◽  
...  

A gallium nitride (GaN) semiconductor vertical field-effect transistor (VFET) has several attractive advantages such as high power density capability and small device size. Currently, some of the main issues hindering its development include the realization of normally off operation and the improvement of high breakdown voltage (BV) characteristics. In this work, a trenched-gate scheme is employed to realize the normally off VFET. Meanwhile, an additional back current blocking layer (BCBL) is proposed and inserted into the GaN normally off VFET to improve the device performance. The electrical characteristics of the proposed device (called BCBL-VFET) are investigated systematically and the structural parameters are optimized through theoretical calculations and TCAD simulations. We demonstrate that the BCBL-VFET exhibits a normally off operation with a large positive threshold voltage of 3.5 V and an obviously increased BV of 1800 V owing to the uniform electric field distribution achieved around the gate region. However, the device only shows a small degradation of on-resistance (RON). The proposed scheme provides a useful reference for engineers in device fabrication work and will be promising for the applications of power electronics.



2019 ◽  
Vol 53 (10) ◽  
pp. 1279-1281
Author(s):  
N. V. Vostokov ◽  
V. M. Daniltsev ◽  
S. A. Kraev ◽  
V. L. Krukov ◽  
E. V. Skorokhodov ◽  
...  


2008 ◽  
Vol 92 (24) ◽  
pp. 243103 ◽  
Author(s):  
Seung Yol Jeong ◽  
Seong Chu Lim ◽  
Dong Jae Bae ◽  
Young Hee Lee ◽  
Hyun Jin Shin ◽  
...  




2009 ◽  
Vol 95 (21) ◽  
pp. 213301 ◽  
Author(s):  
Ariel J. Ben-Sasson ◽  
Eran Avnon ◽  
Elina Ploshnik ◽  
Oded Globerman ◽  
Roy Shenhar ◽  
...  


2015 ◽  
Vol 27 (3) ◽  
pp. 233-236 ◽  
Author(s):  
Dan Yang ◽  
Li Zhang ◽  
Haowei Wang ◽  
Yishan Wang ◽  
Zhixiao Li ◽  
...  


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