Structural Investigation of Hydrous TiO2Precipitates and Their Aging Products by X-ray Diffraction, Atomic Force Microscopy, and Transmission Electron Microscopy

1998 ◽  
Vol 37 (4) ◽  
pp. 1317-1323 ◽  
Author(s):  
Juho-Pertti Jalava ◽  
Lauri Heikkilä ◽  
Oskari Hovi ◽  
Reino Laiho ◽  
Erkki Hiltunen ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Structural Investigation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron

Analysis of Sn Behavior During Ni/GeSn Solid-State Reaction by Correlated X-ray Diffraction, Atomic Force Microscopy, and Ex-situ/In-situ Transmission Electron Microscopy

2020 ◽  
Vol 98 (5) ◽  
pp. 365-375
Author(s):  
Andrea Quintero ◽  
Patrice Gergaud ◽  
Jean-Michel Hartmann ◽  
Vincent Delaye ◽  
Nicolas Bernier ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Ex Situ ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron

scholarly journals CuO and Co3O4Nanoparticles: Synthesis, Characterizations, and Raman Spectroscopy

2013 ◽  
Vol 2013 ◽  
pp. 1-6 ◽  
Author(s):  
M. Rashad ◽  
M. Rüsing ◽  
G. Berth ◽  
K. Lischka ◽  
A. Pawlis
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Microwave Irradiation ◽  
High Dispersion ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron

Copper oxide and cobalt oxide (CuO, Co3O4) nanocrystals (NCs) have been successfully prepared in a short time using microwave irradiation without any postannealing treatment. Both kinds of nanocrystals (NCs) have been prepared using copper nitrate and cobalt nitrate as the starting materials and distilled water as the solvent. The resulted powders of nanocrystals (NCs) were characterized by X-ray diffraction (XRD), transmission electron microscopy (TEM), scanning electron microscopy (SEM), and atomic force microscopy (AFM) measurements. The obtained results confirm the presence of the both of oxides nanopowders produced during chemical precipitation using microwave irradiation. A strong emission under UV excitation is obtained from the prepared CuO and Co3O4nanoparticles. The results show that the nanoparticles have high dispersion and narrow size distribution. The line scans of atomic force microscopy (AFM) images of the nanocrystals (NCs) sprayed on GaAs substrates confirm the results of both X-ray diffraction and transmission electron microscopy. Furthermore, vibrational studies have been carried out using Raman spectroscopic technique. Specific Raman peaks have been observed in the CuO and Co3O4nanostructures, and the full width at half maximum (FWHM) of the peaks indicates a small particle size of the nanocrystals.

Defect-Engineered Graded GexSi1-x Buffers on Si (001) with Extreme Low Threading Dislocation Density

1995 ◽  
Vol 378 ◽  
Author(s):  
G. Kissinger ◽  
T. Morgenstern ◽  
G. Morgenstern ◽  
H. B. Erzgräber ◽  
H. Richter
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Dislocation Density ◽  
Threading Dislocation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Dislocation Densities ◽  
Threading Dislocation Density

AbstractStepwise equilibrated graded GexSii-x (x≤0.2) buffers with threading dislocation densities between 102 and 103 cm−2 on the whole area of 4 inch silicon wafers were grown and studied by transmission electron microscopy, defect etching, atomic force microscopy and photoluminescence spectroscopy.

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