Plasmonic Imaging of Tuning Electron Tunneling Mediated by a Molecular Monolayer

1987 ◽

Vol 45 ◽

pp. 140-141

Author(s):

J. A. Panitz

Keyword(s):

Stark Effect ◽

Electron Tunneling ◽

Imaging Modality ◽

Tunneling Current ◽

Biological Species ◽

Scanning Tunneling ◽

Biological Macromolecules ◽

Flat Surfaces ◽

Virus Particles ◽

Stm Images

Tunneling is a ubiquitous phenomenon. Alpha particle disintegration, the Stark effect, superconductivity in thin films, field-emission, and field-ionization are examples of electron tunneling phenomena. In the scanning tunneling microscope (STM) electron tunneling is used as an imaging modality. STM images of flat surfaces show structure at the atomic level. However, STM images of large biological species deposited onto flat surfaces are disappointing. For example, unstained virus particles imaged in the STM do not resemble their TEM counterparts.It is not clear how an STM image of a biological species is formed. Most biological species are large compared to the nominal electrode separation of ∼ 1nm that is required for electron tunneling. To form an image of a biological species, the tunneling electrodes must be separated by a distance that would normally be too large for a tunneling current to be observed.

Download Full-text

Field-assisted ionization theory for microscopists

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100171833 ◽

1994 ◽

Vol 52 ◽

pp. 820-821

Author(s):

Patrick P. Camus

Keyword(s):

Electric Field ◽

Electron Tunneling ◽

Ionization Probability ◽

Critical Distance ◽

Tunneling Probability ◽

Field Ionization ◽

Radius Of Curvature ◽

Field Evaporation ◽

A Value ◽

Ion Emission

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).

Download Full-text

Principles of electron tunneling spectroscopy

Uspekhi Fizicheskih Nauk ◽

10.3367/ufnr.0152.198708t.0715 ◽

1987 ◽

Vol 152 (8) ◽

pp. 715

Author(s):

V.S. Svistunov

Keyword(s):

Electron Tunneling ◽

Tunneling Spectroscopy ◽

Electron Tunneling Spectroscopy

Download Full-text

Sensing of dynamic charge states using single-electron tunneling transistors

Uspekhi Fizicheskih Nauk ◽

10.3367/ufnr.0168.199802ac.0219 ◽

1998 ◽

Vol 168 (2) ◽

pp. 219

Author(s):

V.A. Krupenin ◽

S.V. Lotkhov ◽

H. Scherer ◽

A.B. Zorin ◽

F.-J. Ahlers ◽

...

Keyword(s):

Electron Tunneling ◽

Single Electron ◽

Single Electron Tunneling ◽

Dynamic Charge ◽

Charge States

Download Full-text

Inelastic Electron Tunneling Spectroscopy

10.1007/978-3-642-81228-6 ◽

1978 ◽

Cited By ~ 28

Keyword(s):

Electron Tunneling ◽

Tunneling Spectroscopy ◽

Inelastic Electron ◽

Inelastic Electron Tunneling Spectroscopy ◽

Inelastic Electron Tunneling ◽

Electron Tunneling Spectroscopy

Download Full-text

Marcus-Hush Theory Revealed by Electron Tunneling Through Hexagonal Boron Nitride

10.26434/chemrxiv.9275135.v1 ◽

2019 ◽

Author(s):

Matěj Velický ◽

Sheng Hu ◽

Colin R. Woods ◽

Peter S. Toth ◽

Viktor Zólyomi ◽

...

Keyword(s):

Electron Transfer ◽

Boron Nitride ◽

Electron Tunneling ◽

Hexagonal Boron Nitride ◽

Large Body ◽

Liquid Solution ◽

Limiting Current ◽

Electron Transfer Rate Constant ◽

Electrochemical Parameters ◽

Voltammetric Measurements

Marcus-Hush theory of electron transfer is one of the pillars of modern electrochemistry with a large body of supporting experimental evidence presented to date. However, some predictions, such as the electrochemical behavior at microdisk electrodes, remain unverified. Herein, we present a study of electron tunneling across a hexagonal boron nitride barrier between a graphite electrode and redox levels in a liquid solution. This was achieved by the fabrication of microdisk electrodes with a typical diameter of 5 µm. Analysis of voltammetric measurements, using two common redox mediators, yielded several electrochemical parameters, including the electron transfer rate constant, limiting current, and transfer coefficient. They show a significant departure from the Butler-Volmer behavior in a clear manifestation of the Marcus-Hush theory of electron transfer. In addition, our system provides a novel experimental platform, which could be applied to address a number of scientific problems such as identification of reaction mechanisms, surface modification, or long-range electron transfer.

Download Full-text

Dendritic Growth Failure of a Mesa Diode

ISTFA 1997: Conference Proceedings from the 23rd International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa1997p0179 ◽

1997 ◽

Author(s):

P. Singh ◽

V. Cozzolino ◽

G. Galyon ◽

R. Logan ◽

K. Troccia ◽

...

Keyword(s):

Electric Fields ◽

Dendritic Growth ◽

Silicon Oxide ◽

Impact Ionization ◽

Electron Tunneling ◽

Growth Failure ◽

Side Wall ◽

Oxide Interface ◽

Band Bending ◽

Cross Section Area

Abstract The time delayed failure of a mesa diode is explained on the basis of dendritic growth on the oxide passivated diode side walls. Lead dendrites nucleated at the p+ side Pb-Sn solder metallization and grew towards the n side metallization. The infinitesimal cross section area of the dendrites was not sufficient to allow them to directly affect the electrical behavior of the high voltage power diodes. However, the electric fields associated with the dendrites caused sharp band bending near the silicon-oxide interface leading to electron tunneling across the band gap at velocities high enough to cause impact ionization and ultimately the avalanche breakdown of the diode. Damage was confined to a narrow path on the diode side wall because of the limited influence of the electric field associated with the dendrite. The paper presents experimental details that led to the discovery of the dendrites. The observed failures are explained in the context of classical semiconductor physics and electrochemistry.

Download Full-text