Self-Assembly Behavior of Poly(methacrylic acid-block-ethyl acrylate) Polymer in Aqueous Medium:  Potentiometric Titration and Laser Light Scattering Studies

2004 ◽  
Vol 108 (5) ◽  
pp. 1621-1627 ◽  
Author(s):  
C. Wang ◽  
P. Ravi ◽  
K. C. Tam ◽  
L. H. Gan
Keyword(s):  
Light Scattering ◽  
Aqueous Medium ◽  
Potentiometric Titration ◽  
Methacrylic Acid ◽  
Self Assembly ◽  
Laser Light ◽  
Ethyl Acrylate ◽  
Laser Light Scattering ◽  
Assembly Behavior ◽  
Acrylate Polymer

A supramolecular ladder polymer prepared by hydrogen bonding-mediated self-assembly of a metallomacrocycle

2015 ◽  
Vol 51 (12) ◽  
pp. 2349-2352 ◽  
Author(s):  
Chun-Fai Ng ◽  
Hak-Fun Chow
Keyword(s):  
Hydrogen Bonding ◽  
Light Scattering ◽  
Self Assembly ◽  
Laser Light ◽  
Laser Light Scattering ◽  
Dynamic Laser Light Scattering ◽  
Ladder Polymer

A defect-free supramolecular ladder polymer was prepared by H-bond-mediated self-assembly of a metallocycle 1 as determined by NMR, viscometry and dynamic laser light scattering studies.

Fractal self-assembly and aggregation of human amylin

Soft Matter ◽  
2020 ◽  
Vol 16 (12) ◽  
pp. 3143-3153 ◽  
Author(s):  
Suparna Khatun ◽  
Anurag Singh ◽  
Somnath Maji ◽  
Tapas Kumar Maiti ◽  
Nisha Pawar ◽  
...  
Keyword(s):  
Molecular Docking ◽  
Light Scattering ◽  
Self Assembly ◽  
Laser Light ◽  
Laser Light Scattering ◽  
Fractal Characteristics ◽  
Human Amylin

pH and solvent sensitive fractal self-assembly of human amylin and fractal characteristics of its aggregates are investigated using different microscopy, laser light scattering, and molecular docking techniques.

Kinetics of Ferritin Self-Assembly by Laser Light Scattering: Impact of Subunit Concentration, pH, and Ionic Strength

2021 ◽  
Vol 22 (4) ◽  
pp. 1389-1398
Author(s):  
Abhinav Mohanty ◽  
Mithra K ◽  
Sidhartha S. Jena ◽  
Rabindra K. Behera
Keyword(s):  
Light Scattering ◽  
Ionic Strength ◽  
Self Assembly ◽  
Laser Light ◽  
Laser Light Scattering ◽  
Kinetics Of

In-Situ Dual-Wavelength Ellipsometry and Light Scattering Monitoring of Si/Si1−xGex Heterostructures and Multiuantum Wells

1993 ◽  
Vol 324 ◽  
Author(s):  
C. Pickering ◽  
D.A.O. Hope ◽  
W.Y. Leong ◽  
D.J. Robbins ◽  
R. Greef
Keyword(s):  
Growth Rate ◽  
Light Scattering ◽  
Laser Light ◽  
Growth Period ◽  
Laser Light Scattering ◽  
Heterojunction Bipolar Transistor ◽  
Dual Wavelength ◽  
Multi Quantum Well ◽  
Refractive Index Data

AbstractIn-situ dual-wavelength ellipsometry and laser light scattering have been used to monitor growth of Si/Si1−x,Gex heterojunction bipolar transistor and multi-quantum well (MQW) structures. The growth rate of B-doped Si0 8Ge0.2 has been shown to be linear, but that of As-doped Si is non-linear, decreasing with time. Refractive index data have been obtained at the growth temperature for x = 0.15, 0.20, 0.25. Interface regions ∼ 6-20Å thickness have been detected at hetero-interfaces and during interrupted alloy growth. Period-to-period repeatability of MQW structures has been shown to be ±lML.

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