Characterization of Rhodamine 6G Aggregates Intercalated in Solid Thin Films of Laponite Clay. 2 Fluorescence Spectroscopy

2005 ◽  
Vol 109 (15) ◽  
pp. 7443-7450 ◽  
Author(s):  
V. Martínez Martínez ◽  
F. López Arbeloa ◽  
J. Bañuelos Prieto ◽  
I. López Arbeloa
2004 ◽  
Vol 108 (52) ◽  
pp. 20030-20037 ◽  
Author(s):  
V. Martínez Martínez ◽  
F. López Arbeloa ◽  
J. Bañuelos Prieto ◽  
T. Arbeloa López ◽  
I. López Arbeloa

Langmuir ◽  
2004 ◽  
Vol 20 (14) ◽  
pp. 5709-5717 ◽  
Author(s):  
V. Martínez Martínez ◽  
F. López Arbeloa ◽  
J. Bañuelos Prieto ◽  
T. Arbeloa López ◽  
I. López Arbeloa

2009 ◽  
Vol 18 (12) ◽  
pp. 125012 ◽  
Author(s):  
S K Tripathi ◽  
Alka Monga ◽  
G S S Saini
Keyword(s):  

2008 ◽  
Vol 62 (3) ◽  
pp. 290-294 ◽  
Author(s):  
Jordan M. Steves ◽  
Loraine T. Tan ◽  
Joseph A. Gardella ◽  
Robert Hard ◽  
Wesley L. Hicks ◽  
...  

Rhodamine 6G (R6G) doped thin films composed of poly(L-lactic acid) (PLLA) and Pluronic P104 were spin cast onto glass microscope slides and characterized by ultraviolet–visible, steady-state, and time-resolved fluorescence spectroscopy. The results show that R6G aggregation within the film increases as the R6G concentration and P104 loading increases. These results suggest an approach for studying drug distributions (monomers, aggregates) within biodegradable polymer formulations.


1992 ◽  
Vol 259 ◽  
Author(s):  
L.V. Munukutla ◽  
K. Evans ◽  
M.H. Liaw

ABSTRACTEllipsometry in combination with X-ray fluorescence spectroscopy is demonstrated as a suitable technique to characterize SiGe thin films (180–800 Å) rapidly and nondestructively. Film thickness values extracted from ellipsometry are in agreement with the measurements obtained using other techniques such as TEM, SIMS, and RBS. The measured Ge concentration obtained by direct excitation of X-rays in several SiGe films ranging from 6 to 20 atomic percent, shows good correlation with the values obtained using RBS and SIMS.


2011 ◽  
Vol 225 (9-10) ◽  
pp. 1055-1072
Author(s):  
Daniel Riebe ◽  
Martin Zühlke ◽  
Karl Zenichowski ◽  
Toralf Beitz ◽  
Carsten Dosche ◽  
...  

Author(s):  
J.B. Posthill ◽  
R.P. Burns ◽  
R.A. Rudder ◽  
Y.H. Lee ◽  
R.J. Markunas ◽  
...  

Because of diamond’s wide band gap, high thermal conductivity, high breakdown voltage and high radiation resistance, there is a growing interest in developing diamond-based devices for several new and demanding electronic applications. In developing this technology, there are several new challenges to be overcome. Much of our effort has been directed at developing a diamond deposition process that will permit controlled, epitaxial growth. Also, because of cost and size considerations, it is mandatory that a non-native substrate be developed for heteroepitaxial nucleation and growth of diamond thin films. To this end, we are currently investigating the use of Ni single crystals on which different types of epitaxial metals are grown by molecular beam epitaxy (MBE) for lattice matching to diamond as well as surface chemistry modification. This contribution reports briefly on our microscopic observations that are integral to these endeavors.


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