Nanoscale Mapping of Strain and Composition in Quantum Dots Using Kelvin Probe Force Microscopy

Nano Letters ◽

10.1021/nl071031w ◽

2007 ◽

Vol 7 (7) ◽

pp. 2089-2093 ◽

Author(s):

S. Shusterman ◽

A. Raizman ◽

A. Sher ◽

Y. Paltiel ◽

A. Schwarzman ◽

...

Keyword(s):

Quantum Dots ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy

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Comparative study of donor-induced quantum dots in Si nano-channels by single-electron transport characterization and Kelvin probe force microscopy

Journal of Applied Physics ◽

10.1063/1.4923229 ◽

2015 ◽

Vol 117 (24) ◽

pp. 244307 ◽

Author(s):

K. Tyszka ◽

D. Moraru ◽

A. Samanta ◽

T. Mizuno ◽

R. Jabłoński ◽

...

Keyword(s):

Quantum Dots ◽

Electron Transport ◽

Comparative Study ◽

Kelvin Probe Force Microscopy ◽

Single Electron ◽

Kelvin Probe ◽

Force Microscopy ◽

Single Electron Transport

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Electric dipole of InN/InGaN quantum dots and holes and giant surface photovoltage directly measured by Kelvin probe force microscopy

Scientific Reports ◽

10.1038/s41598-020-62820-3 ◽

2020 ◽

Vol 10 (1) ◽

Author(s):

Yinping Qian ◽

Peng Wang ◽

Lujia Rao ◽

Changkun Song ◽

Hongjie Yin ◽

...

Keyword(s):

Quantum Dots ◽

Electric Dipole ◽

Kelvin Probe Force Microscopy ◽

Surface Photovoltage ◽

Kelvin Probe ◽

Force Microscopy

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Study of charge quantization in individual silicon quantum dots using Kelvin Probe Force Microscopy

10.7567/ssdm.2004.g-7-4 ◽

2004 ◽

Author(s):

M. A. Salem ◽

Y. Tsuchiya ◽

K. Usami ◽

H. Mizuta ◽

S. Oda

Keyword(s):

Quantum Dots ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Silicon Quantum Dots ◽

Force Microscopy ◽

Charge Quantization

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Imaging the Photocarrier Dynamics in Organic, Hybrid and Two-Dimensional Photovoltaic Materials by Time-Resolved Kelvin Probe Force Microscopy

10.29363/nanoge.fallmeeting.2018.014 ◽

2018 ◽

Author(s):

Benjamin GREVIN

Keyword(s):

Kelvin Probe Force Microscopy ◽

Two Dimensional ◽

Kelvin Probe ◽

Time Resolved ◽

Force Microscopy ◽

Organic Hybrid ◽

Photovoltaic Materials

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Direct observation of contact potential distributions of wafer-bonded p-GaAs/n-GaN and p-GaAs/n-Si by scanning Kelvin probe force microscopy

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/abc02a ◽

2020 ◽

Vol 59 (11) ◽

pp. 115502

Author(s):

Zhiwei Xing ◽

Wenxian Yang ◽

Yukun Zhao ◽

Junhua Long ◽

Xuefei Li ◽

...

Keyword(s):

Direct Observation ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Contact Potential ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Energy-Level Alignment at Interfaces between Transition-Metal Dichalcogenide Monolayers and Metal Electrodes Studied with Kelvin Probe Force Microscopy

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.1c01612 ◽

2021 ◽

Author(s):

Pavel A. Markeev ◽

Emad Najafidehaghani ◽

Ziyang Gan ◽

Kai Sotthewes ◽

Antony George ◽

...

Keyword(s):

Transition Metal ◽

Energy Level ◽

Kelvin Probe Force Microscopy ◽

Transition Metal Dichalcogenide ◽

Kelvin Probe ◽

Metal Electrodes ◽

Force Microscopy ◽

Energy Level Alignment

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Real-space measurement of potential distribution in PECVD ONO electrets by Kelvin probe force microscopy

Nanotechnology ◽

10.1088/0957-4484/27/20/205703 ◽

2016 ◽

Vol 27 (20) ◽

pp. 205703 ◽

Author(s):

F Emmerich ◽

C Thielemann

Keyword(s):

Potential Distribution ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Space Measurement

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Surface photovoltage analysis of thin CdS layers on polycrystalline chalcopyrite absorber layers by Kelvin probe force microscopy

Nanotechnology ◽

10.1088/0957-4484/19/14/145705 ◽

2008 ◽

Vol 19 (14) ◽

pp. 145705 ◽

Author(s):

Th Glatzel ◽

M Rusu ◽

S Sadewasser ◽

M Ch Lux-Steiner

Keyword(s):

Kelvin Probe Force Microscopy ◽

Surface Photovoltage ◽

Kelvin Probe ◽

Force Microscopy

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Kelvin Probe Force Microscopy investigations of High Strength Metallurgical Graphene transferred on low-density polyethylene

Microelectronic Engineering ◽

10.1016/j.mee.2016.02.046 ◽

2016 ◽

Vol 157 ◽

pp. 71-77 ◽

Author(s):

Krzysztof Gajewski ◽

Witold Szymański ◽

Piotr Niedzielski ◽

Teodor Gotszalk

Keyword(s):

High Strength ◽

Kelvin Probe Force Microscopy ◽

Low Density Polyethylene ◽

Low Density ◽

Kelvin Probe ◽

Force Microscopy

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Identifying DNA mismatches at single-nucleotide resolution by probing individual surface potentials of DNA-capped nanoparticles

Nanoscale ◽

10.1039/c7nr05250b ◽

2018 ◽

Vol 10 (2) ◽

pp. 538-547 ◽

Author(s):

Hyungbeen Lee ◽

Sang Won Lee ◽

Gyudo Lee ◽

Wonseok Lee ◽

Kihwan Nam ◽

...

Keyword(s):

Kelvin Probe Force Microscopy ◽

Powerful Method ◽

Kelvin Probe ◽

Single Nucleotide ◽

Force Microscopy ◽

Surface Potentials ◽

Dna Mismatches ◽

Nucleotide Resolution ◽

Single Nucleotide Resolution

Here, we demonstrate a powerful method to discriminate DNA mismatches at single-nucleotide resolution from 0 to 5 mismatches (χ0 to χ5) using Kelvin probe force microscopy (KPFM).

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