In Situ TEM Observation of Fe-Included Carbon Nanofiber: Evolution of Structural and Electrical Properties in Field Emission Process

ACS Nano ◽  
2012 ◽  
Vol 6 (11) ◽  
pp. 9567-9573 ◽  
Author(s):  
Mohd Zamri Mohd Yusop ◽  
Pradip Ghosh ◽  
Yazid Yaakob ◽  
Golap Kalita ◽  
Masato Sasase ◽  
...  
Keyword(s):  
Electrical Properties ◽  
Field Emission ◽  
Carbon Nanofiber ◽  
In Situ Tem ◽  
Emission Process ◽  
Structural And Electrical Properties

In situ TEM measurements of the electrical properties of interface dislocations

1992 ◽  
Vol 50 (2) ◽  
pp. 1338-1339
Author(s):  
F. M. Ross ◽  
R. Hull ◽  
D. Bahnck ◽  
J. C. Bean ◽  
L. J. Peticolas ◽  
...  
Keyword(s):  
Electrical Properties ◽  
Electronic Device ◽  
In Situ Tem ◽  
Device Performance ◽  
Misfit Dislocations ◽  
Electrical Characteristics ◽  
Strained Layer ◽  
Transmission Electron ◽  
Interfacial Dislocations

We describe an investigation of the electrical properties of interfacial dislocations in strained layer heterostructures. We have been measuring both the structural and electrical characteristics of strained layer p-n junction diodes simultaneously in a transmission electron microscope, enabling us to correlate changes in the electrical characteristics of a device with the formation of dislocations.The presence of dislocations within an electronic device is known to degrade the device performance. This degradation is of increasing significance in the design and processing of novel strained layer devices which may require layer thicknesses above the critical thickness (hc), where it is energetically favourable for the layers to relax by the formation of misfit dislocations at the strained interfaces. In order to quantify how device performance is affected when relaxation occurs we have therefore been investigating the electrical properties of dislocations at the p-n junction in Si/GeSi diodes.

An in situ TEM Study of Field Emission of Electrons from LaB6 Nanowires

2007 ◽  
Vol 13 (S02) ◽  
Author(s):  
H Zhang ◽  
J Tang ◽  
Q Zhang ◽  
O Zhou ◽  
L-C Qin
Keyword(s):  
Field Emission ◽  
In Situ Tem ◽  
Field Emission Of Electrons

Structural and electrical properties of magnetron sputtered Ti(ON) thin films: The case of TiN doped in situ with oxygen

2009 ◽  
Vol 194 (1) ◽  
pp. 93-103 ◽  
Author(s):  
A. Trenczek-Zajac ◽  
M. Radecka ◽  
K. Zakrzewska ◽  
A. Brudnik ◽  
E. Kusior ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrical Properties ◽  
Structural And Electrical Properties

In-situ TEM examination and exceptional long-term cyclic stability of ultrafine Fe3O4 nanocrystal/carbon nanofiber composite electrodes

2015 ◽  
Vol 1 ◽  
pp. 25-34 ◽  
Author(s):  
Zheng-Long Xu ◽  
Biao Zhang ◽  
Yang Gang ◽  
Ke Cao ◽  
Mohammad Akbari Garakani ◽  
...  
Keyword(s):  
Carbon Nanofiber ◽  
In Situ Tem ◽  
Cyclic Stability ◽  
Composite Electrodes ◽  
Nanofiber Composite ◽  
Fe3o4 Nanocrystal

scholarly journals In-situ TEM Study of Optical and Mechanical Effects on Electrical Properties of CuO Nanowires

2013 ◽  
Vol 19 (S2) ◽  
pp. 1496-1497
Author(s):  
S.J. Kim ◽  
J.R. Jokisaari ◽  
A. Kargar ◽  
D. Wang ◽  
X. Pan
Keyword(s):  
Electrical Properties ◽  
In Situ Tem ◽  
Mechanical Effects ◽  
Cuo Nanowires

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

scholarly journals Electrical properties of atomic carbon chains measured by in-situ TEM

2016 ◽  
pp. 392-393
Author(s):  
Florian Banhart ◽  
Alessandro La Torre ◽  
Ferdaous Ben Romdhane ◽  
Ovidiu Cretu ◽  
Andrés Botello-Mendez ◽  
...  
Keyword(s):  
Electrical Properties ◽  
In Situ Tem ◽  
Atomic Carbon ◽  
Carbon Chains

In-Situ Transmission Elecron Microscopy (TEM) Study of the Sintering of Sputtered Copper Nanoparticles on (001) Copper

1997 ◽  
Vol 3 (S2) ◽  
pp. 401-402
Author(s):  
M. Yeadon ◽  
J.C. Yang ◽  
R.S. Averback ◽  
J.W. Bullard ◽  
D.L. Olynick ◽  
...  
Keyword(s):  
Gas Phase ◽  
Copper Nanoparticles ◽  
Room Temperature ◽  
Copper Substrate ◽  
In Situ Tem ◽  
Single Particles ◽  
Fine Grain ◽  
Structural And Electrical Properties ◽  
Nanophase Materials

The large surface area: volume ratios and fine grain size of nanophase materials give rise to novel and exciting structural and electrical properties that are of considerable scientific and technological interest. Using copper as a model system we have investigated the sintering of sputtered copper nanoparticles (4-20nm diameter) with a copper substrate in a novel UHV in-situ TEM.The nanoparticles were generated in a UHV chamber built into the side of the column by sputtering in 1.5Torr Ar. They were transported into the microscope in the gas phase and deposited on an electron transparent (001) copper foil mounted on a heated support. A typical bright-field (BF) image of the sample immediately after deposition at room temperature is shown in Fig. 1. The particles have assumed a random orientation on the substrate and remain stable for many hours at room temperature. The presence of both single particles and agglomerates of particles is evident in this image and examples are labelled ‘P’ and ‘A’, respectively

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