High-resolution photoabsorption cross-section measurements of SO2at 198 K from 213 to 325 nm

Despite their importance to the photochemistry of the terrestrial atmosphere, and many experimental studies, previous characterization of the Schumann–Runge (SR) bands of O 2, [Formula: see text] (1750–2050 Å) has been limited by poor experimental resolution. In addition, our understanding of the SR spectrum is incomplete, many rovibrational transitions in the perturbed region of the spectrum [B(v > 15)] remaining unassigned. We review new very-high-resolution measurements of the O 2 photoabsorption cross section in the SR bands. Tunable, narrow-bandwidth background vacuum-ultraviolet (VUV) radiation for the measurements (~ 7 × 105 resolving power) was generated by the two-photon-resonant difference-frequency four-wave mixing in Xe of excimer-pumped dye-laser radiation. With the aid of these cross-section measurements, rovibrational and line-shape analyses have led to new insights into the molecular structure and predissociation dynamics of O 2. The current VUV laser-spectroscopic measurements are shown to compare favourably with results from two other very-high-resolution experimental techniques, namely laser-induced fluorescence spectroscopy and VUV Fourier-transform spectroscopy, the latter performed using a synchrotron source.

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Correction to “High-resolution photoabsorption cross-section measurements of SO2at 198 K from 213 to 325 nm”

Journal of Geophysical Research Atmospheres ◽

10.1029/2011je003977 ◽

2011 ◽

Vol 116 (E12) ◽

Cited By ~ 8

Author(s):

D. Blackie ◽

R. Blackwell-Whitehead ◽

G. Stark ◽

J. C. Pickering ◽

P. L. Smith ◽

...

Keyword(s):

High Resolution ◽

Cross Section ◽

Photoabsorption Cross Section

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High-Resolution Measurement of Fine Structure in the Photoabsorption Cross Section of18O

Physical Review Letters ◽

10.1103/physrevlett.80.33 ◽

1998 ◽

Vol 80 (1) ◽

pp. 33-36 ◽

Cited By ~ 24

Author(s):

H. Harada ◽

Y. Shigetome ◽

H. Ohgaki ◽

T. Noguchi ◽

T. Yamazaki

Keyword(s):

Fine Structure ◽

High Resolution ◽

Cross Section ◽

Photoabsorption Cross Section ◽

High Resolution Measurement ◽

Resolution Measurement

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High-resolution photoabsorption cross section measurements of SO2, 2: 220 to 325 nm at 295 K

Journal of Geophysical Research Atmospheres ◽

10.1029/2002je001931 ◽

2003 ◽

Vol 108 (E2) ◽

pp. n/a-n/a ◽

Cited By ~ 54

Author(s):

J. Rufus ◽

G. Stark ◽

Peter L. Smith ◽

J. C. Pickering ◽

A. P. Thorne

Keyword(s):

High Resolution ◽

Cross Section ◽

Photoabsorption Cross Section

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High resolution VUV photoabsorption cross section of dimethyl sulphoxide (CH3)2SO

Chemical Physics ◽

10.1016/j.chemphys.2006.11.017 ◽

2007 ◽

Vol 331 (2-3) ◽

pp. 447-452 ◽

Cited By ~ 15

Author(s):

E.A. Drage ◽

P. Cahillane ◽

S.V. Hoffmann ◽

N.J. Mason ◽

P. Limão-Vieira

Keyword(s):

High Resolution ◽

Cross Section ◽

Dimethyl Sulphoxide ◽

Photoabsorption Cross Section

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HRTEM simulation of interfacial structure in amorphous multilayers

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100154305 ◽

1989 ◽

Vol 47 ◽

pp. 466-467

Author(s):

Margaret L. Sattler ◽

Michael A. O'Keefe

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Cross Section ◽

High Resolution Electron Microscopy ◽

Interfacial Structure ◽

Multilayer Sample ◽

Resolution Electron ◽

Multilayered Materials ◽

Simulated Images

Multilayered materials have been fabricated with such high perfection that individual layers having two atoms deep are possible. Characterization of the interfaces between these multilayers is achieved by high resolution electron microscopy and Figure 1a shows the cross-section of one type of multilayer. The production of such an image with atomically smooth interfaces depends upon certain factors which are not always reliable. For example, diffusion at the interface may produce complex interlayers which are important to the properties of the multilayers but which are difficult to observe. Similarly, anomalous conditions of imaging or of fabrication may occur which produce images having similar traits as the diffusion case above, e.g., imaging on a tilted/bent multilayer sample (Figure 1b) or deposition upon an unaligned substrate (Figure 1c). It is the purpose of this study to simulate the image of the perfect multilayer interface and to compare with simulated images having these anomalies.

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Cross Section Analysis of Cu Filled TSVs Based on High Throughput Plasma-FIB Milling

ISTFA 2012: Conference Proceedings from the 38th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2012p0039 ◽

2012 ◽

Author(s):

Frank Altmann ◽

Jens Beyersdorfer ◽

Jan Schischka ◽

Michael Krause ◽

German Franz ◽

...

Keyword(s):

High Resolution ◽

Cross Section ◽

High Throughput ◽

Cross Sections ◽

Electron Backscatter Diffraction ◽

Grain Structure ◽

Electron Backscatter ◽

Section Surface ◽

Backscatter Diffraction ◽

Section Analysis

Abstract In this paper the new Vion™ Plasma-FIB system, developed by FEI, is evaluated for cross sectioning of Cu filled Through Silicon Via (TSV) interconnects. The aim of the study presented in this paper is to evaluate and optimise different Plasma-FIB (P-FIB) milling strategies in terms of performance and cross section surface quality. The sufficient preservation of microstructures within cross sections is crucial for subsequent Electron Backscatter Diffraction (EBSD) grain structure analyses and a high resolution interface characterisation by TEM.

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Photoionization Cross-Sections of Carbon-Like N+ Near the K-Edge (390–440 eV)

Atoms ◽

10.3390/atoms9020027 ◽

2021 ◽

Vol 9 (2) ◽

pp. 27

Author(s):

Jean-Paul Mosnier ◽

Eugene T. Kennedy ◽

Jean-Marc Bizau ◽

Denis Cubaynes ◽

Ségolène Guilbaud ◽

...

Keyword(s):

High Resolution ◽

Cross Section ◽

Cross Sections ◽

Experimental Studies ◽

Photoionization Cross Section ◽

Theoretical Work ◽

Rydberg Series ◽

R Matrix ◽

Resonance Strengths ◽

Nitrogen Ion

High-resolution K-shell photoionization cross-sections for the C-like atomic nitrogen ion (N+) are reported in the 398 eV (31.15 Å) to 450 eV (27.55 Å) energy (wavelength) range. The results were obtained from absolute ion-yield measurements using the SOLEIL synchrotron radiation facility for spectral bandpasses of 65 meV or 250 meV. In the photon energy region 398–403 eV, 1s⟶2p autoionizing resonance states dominated the cross section spectrum. Analyses of the experimental profiles yielded resonance strengths and Auger widths. In the 415–440 eV photon region 1s⟶(1s2s22p2 4P)np and 1s⟶(1s2s22p2 2P)np resonances forming well-developed Rydberg series up n=7 and n=8 , respectively, were identified in both the single and double ionization spectra. Theoretical photoionization cross-section calculations, performed using the R-matrix plus pseudo-states (RMPS) method and the multiconfiguration Dirac-Fock (MCDF) approach were bench marked against these high-resolution experimental results. Comparison of the state-of-the-art theoretical work with the experimental studies allowed the identification of new resonance features. Resonance strengths, energies and Auger widths (where available) are compared quantitatively with the theoretical values. Contributions from excited metastable states of the N+ ions were carefully considered throughout.

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