Modeling electronic excitations/formation of trap states in semiconducting nanocrystals

2019 ◽  
pp. 173-188
Author(s):  
A. A. Aldongarov ◽  
A. M. Assilbekova ◽  
I. S. Irgibaeva ◽  
N. N. Barashkov
Author(s):  
P. E. Batson ◽  
C. H. Chen ◽  
J. Silcox

Electron energy loss experiments combined with microscopy have proven to be a valuable tool for the exploration of the structure of electronic excitations in materials. These types of excitations, however, are difficult to measure because of their small intensity. In a usual situation, the filament of the microscope is run at a very high temperature in order to present as much intensity as possible at the specimen. This results in a degradation of the ultimate energy resolution of the instrument due to thermal broadening of the electron beam.We report here observations and measurements on a new LaB filament in a microscope-velocity spectrometer system. We have found that, in general, we may retain a good energy resolution with intensities comparable to or greater than those available with the very high temperature tungsten filament. We have also explored the energy distribution of this filament.


1985 ◽  
Vol 147 (11) ◽  
pp. 523 ◽  
Author(s):  
M.I. Klinger ◽  
Ch.B. Lushchik ◽  
T.V. Mashovets ◽  
G.A. Kholodar' ◽  
M.K. Sheinkman ◽  
...  

2020 ◽  
Author(s):  
Dmitry Dirin ◽  
Anna Vivani ◽  
Maryna Bodnarchuk ◽  
Ihor Cherniukh ◽  
Antonietta Guagliardi ◽  
...  
Keyword(s):  

2003 ◽  
Vol 0 (7) ◽  
pp. 2400-2403 ◽  
Author(s):  
R. M. Chu ◽  
Y. G. Zhou ◽  
K. J. Chen ◽  
K. M. Lau
Keyword(s):  

2021 ◽  
Vol 195 ◽  
pp. 113725
Author(s):  
Vishnu Kumar ◽  
Anuradha Bhogra ◽  
Manju Bala ◽  
Hung-Wei Kuo ◽  
Chi-Liang Chen ◽  
...  

Author(s):  
Jing Ren ◽  
Shurong Wang ◽  
Jianxing Xia ◽  
Chengbo Li ◽  
Lisha Xie ◽  
...  

Defects, inevitably produced in the solution-processed halide perovskite films, can act as charge carrier recombination centers to induce severe energy loss in perovskite solar cells (PSCs). Suppressing these trap states...


2008 ◽  
Vol 1091 ◽  
Author(s):  
Hung-Keng Chen ◽  
Po-Tsun Liu ◽  
Ting-Chang Chang ◽  
S.-L. Shy

AbstractVariable temperature electrical measurement is well-established and used for determining the conduction mechanism in semiconductors. There is a Meyer¡VNeldel relationship between the activation energy and the prefactor with a Meyer¡VNeldel energy of 30.03 meV, which corresponds well with the isokinetic temperature of about 350 K. Therefore, the multiple trapping and release model is properly used to explain the thermally activated phenomenon. By the method, an exponential distribution of traps is assumed to be a better representation of trap states in band tail. Samples with higher temperature during measurement are observed to show better mobility, higher on-current and lower resistance, which agree well with the multiple trapping and release model proposed to explain the conduction mechanism in pentacene-based OTFTs.


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