NEXAFS and XPS studies of nitrosyl chloride

2015 ◽  
Vol 17 (14) ◽  
pp. 9040-9048 ◽  
Author(s):  
Luca Schio ◽  
Cui Li ◽  
Susanna Monti ◽  
Peter Salén ◽  
Vasyl Yatsyna ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
Gas Phase ◽  
Theoretical Study ◽  
Nitrosyl Chloride ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
X Ray Absorption

The electronic structure of nitrosyl chloride (ClNO) has been investigated in the gas phase by X-ray Photoelectron (XPS) and Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy at the Cl 2p, Cl 2s, N 1s and O 1s edges in a combined experimental and theoretical study.

Electronic Structure of Individual Hybrid Colloid Particles Studied by Near-Edge X-ray Absorption Fine Structure (NEXAFS) Spectroscopy in the X-ray Microscope

Nano Letters ◽  
2013 ◽  
Vol 13 (2) ◽  
pp. 824-828 ◽  
Author(s):  
Katja Henzler ◽  
Peter Guttmann ◽  
Yan Lu ◽  
Frank Polzer ◽  
Gerd Schneider ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
Colloid Particles ◽  
X Ray Absorption

Local electronic structure analysis of Zn-doped BiFeO3 powders by X-ray absorption fine structure spectroscopy

2017 ◽  
Vol 710 ◽  
pp. 843-849 ◽  
Author(s):  
Turghunjan Gholam ◽  
Abduleziz Ablat ◽  
Mamatrishat Mamat ◽  
Rong Wu ◽  
Aimierding Aimidula ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
Structure Analysis ◽  
X Ray ◽  
Absorption Fine ◽  
Local Electronic Structure ◽  
X Ray Absorption

Near Edge X-Ray Absorption Fine Structure (NEXAFS) Microscopy: Chemical Analysis at Sub Visible Spatial Resolution

1997 ◽  
Vol 3 (S2) ◽  
pp. 851-852
Author(s):  
H. Ade
Keyword(s):  
Fine Structure ◽  
Compositional Analysis ◽  
High Sensitivity ◽  
Linear Dichroism ◽  
X Rays ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
Wide Range ◽  
X Ray Absorption

Infrared, Raman, and fluorescence/luminescence microspectroscopy/microscopy in many instances seek to provide high sensitivity compositional and functional information that goes beyond mere elemental composition. This goal is shared by NEXAFS microscopy, in which Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy is employed to provide chemical sensitivity and can be relatively easily adopted in a scanning transmission x-ray microscope (STXM). In addition to compositional information, NEXAFS microscopy can exploit the dependence of x-ray absorption resonances on the bond orientation relative to the linearly polarized x rays (linear dichroism microscopy). For compositional analysis, NEXAFS microscopy is analogous to Electron Energy Loss Spectroscopy (EELS) in an electron microscope. However, when utilizing near edge spectral features, NEXAFS microscopy requires a considerable lower dose than EELS microscopy which makes it very suitable to studying radiation sensitive materials such as polymers. NEXAFS has shown to have excellent sensitivity to a wide range of moieties in polymers, including sensitivity to substitution isomerism.

Erratum: “The C 1s and N 1s near edge x-ray absorption fine structure spectra of five azabenzenes in the gas phase” [J. Chem. Phys. 128, 044316 (2008)]

2009 ◽  
Vol 130 (16) ◽  
pp. 169902
Author(s):  
G. Vall-llosera ◽  
B. Gao ◽  
A. Kivimäki ◽  
M. Coreno ◽  
J. Álvarez Ruiz ◽  
...  
Keyword(s):  
Fine Structure ◽  
Gas Phase ◽  
Chem Phys ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Investigating the structure of boron nitride nanotubes by near-edge X-ray absorption fine structure (NEXAFS) spectroscopy

2005 ◽  
Vol 7 (6) ◽  
pp. 1103 ◽  
Author(s):  
Tirandai Hemraj-Benny ◽  
Sarbajit BanerjeeCurrent address: Department ◽  
Sharadha Sambasivan ◽  
Daniel A. Fischer ◽  
Weiqiang Han ◽  
...  
Keyword(s):  
Fine Structure ◽  
Boron Nitride ◽  
Boron Nitride Nanotubes ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
X Ray Absorption

Gas-Phase Experimental and Theoretical Near Edge X-ray Absorption Fine Structure Study of 2-Mercaptobenzothiazole

2001 ◽  
Vol 105 (30) ◽  
pp. 7308-7314 ◽  
Author(s):  
G. Contini ◽  
V. Carravetta ◽  
V. Di Castro ◽  
S. Stranges ◽  
R. Richter ◽  
...  
Keyword(s):  
Fine Structure ◽  
Gas Phase ◽  
Structure Study ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

3C-, 4H- and 6H-SiC Bulks Studied by Silicon K-Edge X-Ray Absorption

2013 ◽  
Vol 740-742 ◽  
pp. 573-576 ◽  
Author(s):  
Wei Zeng ◽  
Zhe Chuan Feng ◽  
Rui Sheng Zheng ◽  
Ling Yun Jang ◽  
Chee Wei Liu
Keyword(s):  
Electronic Structure ◽  
Fine Structure ◽  
High Resolution ◽  
Synchrotron Radiation ◽  
Angular Dependence ◽  
Comparative Studies ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

High-resolution synchrotron radiation X-ray absorption of Si K-edge have been employed to investigate 6H-, 4H- and 3C-SiC. Detailed analyses of the extended x-ray absorption fine structure are taken by using the IFEFFIT program, and significant results on the atomic bonding are obtained from these comparative studies. The x-ray absorption near-edge structures of the Si K-edge are investigated, and the electronic structure of 3C-, 4H- and 6H-SiC are studied. In order to investigate the angular dependence, the x-ray absorption near-edge spectra were operated at 55o and 90o of the angle between the surface and the X-ray direction.

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