In situ investigation of the surface morphology evolution of the bulk ceramic Y2Mo3O12 during crystal water release

2015 ◽  
Vol 17 (16) ◽  
pp. 10363-10368 ◽  
Author(s):  
Y. G. Cheng ◽  
X. S. Liu ◽  
H. J. Chen ◽  
M. J. Chao ◽  
E. J. Liang
Keyword(s):  
Surface Morphology ◽  
Morphology Evolution ◽  
Water Release ◽  
Crystal Water ◽  
Force Microscopy ◽  
Bulk Ceramic ◽  
Atomic Force ◽  
In Situ Investigation ◽  
Surface Morphology Evolution

The surface morphology evolution of the bulk ceramic Y2Mo3O12 during the release of crystal water is followed in situ for the first time using atomic force microscopy.

Nucleation and surface morphology evolution of ferroelectric SrBi2Ta2O9 films studied by atomic force microscopy

1998 ◽  
Vol 405 (2-3) ◽  
pp. L554-L560 ◽  
Author(s):  
Q.D Jiang ◽  
Z.J Huang ◽  
P Jin ◽  
C.L Chen ◽  
A Brazdeikis ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Morphology Evolution ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Morphology Evolution

Surface morphology of As-deposited and laser-damaged dielectric mirror coatings studied in-situ by atomic force microscopy

1992 ◽  
Author(s):  
Mark R. Kozlowski ◽  
Michael C. Staggs ◽  
Mehdi Balooch ◽  
Robert J. Tench ◽  
Wigbert J. Siekhaus
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Force Microscopy ◽  
Dielectric Mirror ◽  
Atomic Force

Chromic Polydiacetylene Single Crystals: Atomic Force Microscopy Studies

1995 ◽  
Vol 413 ◽  
Author(s):  
V. Shivshankar ◽  
C. Sung ◽  
J. Kumar ◽  
S. K. Tripathy ◽  
D. J. Sandman
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Single Crystals ◽  
Ambient Conditions ◽  
Free Standing ◽  
Force Microscopy ◽  
Sensor Performance ◽  
Atomic Force ◽  
Variable Surface

ABSTRACTWe have studied the surface morphology of free standing single crystals of thermochromic polydiacetylenes (PDAs), namely, ETCD and IPUDO (respectively, the ethyl and isopropyl urethanes of 5,7-dodecadiyn-1,12-diol), by Atomic Force Microscopy (AFM) under ambient conditions. Micron scale as well as molecularly resolved images were obtained. The micron scale images indicate a variable surface, and the molecularly resolved images show a well defined 2-D lattice that is interpreted in terms of molecular models and known crystallographic data. Thereby information about surface morphology, which is crucial to potential optical device or chromic sensor performance is available. We also report the observation of a “macroscopic shattering” of the IPUDO monomer crystal during in-situ UV polymerization studies.

In-situ investigation of surface processes on AlGaAs/GaAs cleavage edges as studied by atomic force microscopy

1995 ◽  
Vol 353 (5-8) ◽  
pp. 670-674
Author(s):  
T. Prohaska ◽  
G. Friedbacher ◽  
M. Grasserbauer ◽  
H. Nickel ◽  
R. L�sch ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Processes ◽  
Force Microscopy ◽  
Atomic Force ◽  
In Situ Investigation

Dielectric and Electromechanical Behaviour of Relaxor [(1−x)Pb(Mg1/3Nb2/3)O3 -xPbTiO3] Thin Films

2001 ◽  
Vol 688 ◽  
Author(s):  
N.J. Donnelly ◽  
G. Catalan ◽  
C. Morros ◽  
R.M. Bowman ◽  
J.M. Gregg
Keyword(s):  
Thin Films ◽  
Single Crystal ◽  
Plane Strain ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Bulk Ceramic ◽  
Atomic Force ◽  
Out Of Plane ◽  
Order Of Magnitude

AbstractThin film capacitor structures of Au / (1−x)Pb(Mg1/3Nb2/3)O3 - xPbTiO3 /(La1/2Sr1/2)CoO3 were fabricated by pulsed laser deposition on single crystal {001} MgO substrates. Films were found to be perovskite dominated and highly {001} oriented. Dielectrically, films displayed relaxorlike features, though maximum permittivity was low compared to single crystal or bulk ceramic (∼1400 at peak @1kHz, for x=0.07, 0.1 & 0.2). A field induced piezoelectric coefficient d33 was measured by piezoresponse atomic force microscopy for specific compositions x =0, × =0.07, and x =0.1 and found to be disappointingly low - indicating poor electric field induced strain. Despite this macroscopic electrostrictive coefficients Q33 were found to be (3.6 ± 0.6) ×10−2C−2m4, (2.6 ± 0.2) ×10−2C−2m4, and (0.9 ± 0.3) ×10−2C−2m4 respectively. Crystallographic electrostrictive coefficients were determined by in-situ x-ray diffraction and found to be (4.9 ± 0.2) ×10−2C−2m4 for PMN-(0.07)PT and (1.9 ± 0.1) ×10−2C−2m4 for PMN-(0.1)PT. Considering that all these Q33 values are of the same order of magnitude as found in single crystal experiments (2.5 – 3.8 ×10−2C−2m4), it is suggested that low out-of-plane strain is entirely a result of reduced polarisability rather than reduced electrostrictive coefficients in thin films relative to bulk ceramic or single crystal. An estimate was also made of the Q13 electrostrictive coefficient for PMN and PMN-(0.07)PT by measuring permittivity as a function of applied in-plane strain. The values obtained were -1.31 ×10−2C−2m4 and -0.46 ×10−2C−2m4 respectively.

Polyaniline Surface Morphology During The Doping Process Using Atomic Force Microscopy

1993 ◽  
Vol 328 ◽  
Author(s):  
Leonard J. Buckley
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Polymer Surface ◽  
Force Microscopy ◽  
Atomic Force ◽  
Base Solution ◽  
Acid And Base ◽  
Polyaniline Films ◽  
Doped Polymer

ABSTRACTChemically synthesized polyaniline films were studied during the doping and dedoping process by imaging the polymer surface using in-situ Atomic Force Microscopy (AFM). The polymer, which was initially in the base non-conducting form was doped using aqueous acidic solutions of both tosylic (pH=0.2) and HCl (pH of 0.2 and 1.0). Dedoping was accomplished by exposing the same doped polymer surface to NH4OH (pH=12) base solution. AFM images showed that it was necessary to cycle the polymer surface 3 times between acid and base before a reproducible surface morphology was established between the doped and dedoped states. For the case of doping with tosylic acid AFM images showed that the polyaniline surface was immediately roughened. In addition there appeared to be an increase in the size of surface channels and cracks. When doping with HC1 (pH=1.0), no change in surface morphology was observed; however, noticeable surface roughening occurred over 10 Minutes for the case of the lower pH=0.2 solution. The complex permittivity and DC conductivity was measured to estimate the level of protonation in the AFM samples.

Light Scattering Study of the Evolution of the Surface Morphology During Growth of Ingaas on GaAs

1994 ◽  
Vol 375 ◽  
Author(s):  
C. Lavoie ◽  
B. Haveman ◽  
E. Nodwell ◽  
T. Pinnington ◽  
T. Tiedje ◽  
...  
Keyword(s):  
Light Scattering ◽  
Surface Morphology ◽  
Ex Situ ◽  
Molecular Beam Epitaxy Growth ◽  
Elastic Light Scattering ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scattering Study ◽  
Good Agreement

AbstractIn-situ elastic light scattering is used to measure the evolution of the surface morphology of InxGa1−xAs films during molecular beam epitaxy growth on GaAs substrates. The in-situ measurements are compared with ex-situ measurements of the surface morphology on quenched films by optical scatterometry and atomic force microscopy (AFM). The AFM results are in good agreement with the rms roughness obtained from light scattering and both techniques detect the onset of misfit dislocation formation in this system.

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