scholarly journals Chiral nanostructure in polymers under different deposition conditions observed using atomic force microscopy of monolayers: poly(phenylacetylene)s as a case study

2017 ◽  
Vol 53 (3) ◽  
pp. 481-492 ◽  
Author(s):  
F. Freire ◽  
E. Quiñoá ◽  
R. Riguera
Keyword(s):  
Atomic Force Microscopy ◽  
Secondary Structure ◽  
Force Microscopy ◽  
Atomic Force ◽  
Deposition Conditions

Techniques used for the study of the secondary structure of polymers by means of atomic-force microscopy are evaluated.

Die-Level Scanning Capacitance Microscopy Fault Isolation on SOI Fin-FET Devices for Advanced Semiconductor Nodes

2018 ◽  
Author(s):  
Lucile C. Teague Sheridan ◽  
Tanya Schaeffer ◽  
Yuting Wei ◽  
Satish Kodali ◽  
Chong Khiam Oh
Keyword(s):  
Atomic Force Microscopy ◽  
Failure Analysis ◽  
Fault Isolation ◽  
Scanning Capacitance Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Abstract It is widely acknowledged that Atomic force microscopy (AFM) methods such as conductive probe AFM (CAFM) and Scanning Capacitance Microscopy (SCM) are valuable tools for semiconductor failure analysis. One of the main advantages of these techniques is the ability to provide localized, die-level fault isolation over an area of several microns much faster than conventional nanoprobing methods. SCM, has advantages over CAFM in that it is not limited to bulk technologies and can be utilized for fault isolation on SOI-based technologies. Herein, we present a case-study of SCM die-level fault isolation on SOI-based FinFET technology at the 14nm node.

Indentation modulus and hardness of viscoelastic thin films by atomic force microscopy: A case study

2009 ◽  
Vol 109 (12) ◽  
pp. 1417-1427 ◽  
Author(s):  
D. Passeri ◽  
A. Bettucci ◽  
A. Biagioni ◽  
M. Rossi ◽  
A. Alippi ◽  
...  
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Indentation Modulus ◽  
Force Microscopy ◽  
Atomic Force

Correlation of Roughness, Impurity, Infra-Red Emissivity and Sputter Conditions for Aluminium Films

1994 ◽  
Vol 354 ◽  
Author(s):  
C.H. Wang ◽  
W.C. Shih ◽  
R.E. Somekh ◽  
J.E. Evetts ◽  
D. Jackson
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Film Thickness ◽  
Impurity Level ◽  
General Context ◽  
Force Microscopy ◽  
Atomic Force ◽  
Preliminary Work ◽  
Infra Red ◽  
Deposition Conditions

AbstractWe report the results of a study of IR emissivity of aluminium films as a function of impurity level, film thickness and sputtering conditions. Preliminary work suggests that for a given level of film impurities and deposition conditions, the JJR emissivity can be minimized with a certain film thickness. The influence of impurity level, film thickness, and sputter pressure on IR emissivity has been correlated with the resistivity and the surface roughness (measured by atomic force microscopy). The results are discussed in the general context of the Drude theory with allowances for the observed roughness.

Imaging polycrystalline and smoke MgO surfaces with atomic force microscopy: a case study of high resolution image on a polycrystalline oxide

2004 ◽  
Vol 570 (3) ◽  
pp. 155-166 ◽  
Author(s):  
Domenica Scarano ◽  
Serena Bertarione ◽  
Federico Cesano ◽  
Giuseppe Spoto ◽  
Adriano Zecchina
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Force Microscopy ◽  
Resolution Image ◽  
High Resolution Image ◽  
Atomic Force

scholarly journals Single-Molecule Reconstruction of Oligonucleotide Secondary Structure by Atomic Force Microscopy

Small ◽  
2014 ◽  
Vol 10 (16) ◽  
pp. 3257-3261 ◽  
Author(s):  
Alice Pyne ◽  
Ruth Thompson ◽  
Carl Leung ◽  
Debdulal Roy ◽  
Bart W. Hoogenboom
Keyword(s):  
Atomic Force Microscopy ◽  
Secondary Structure ◽  
Single Molecule ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Swelling of individual cellulose nanofibrils in water, role of crystallinity: an AFM study

Cellulose ◽  
2020 ◽  
Author(s):  
Vegar Ottesen ◽  
Kristin Syverud
Keyword(s):  
Atomic Force Microscopy ◽  
Cellulose Nanofibrils ◽  
Platinum Nanowires ◽  
Force Microscopy ◽  
Atomic Force ◽  
Water Swelling ◽  
Fibril Diameter

Abstract Atomic force microscopy (AFM) can be used to quantitatively study nanomaterials in different media, e.g. vacuum, air, or submerged in a liquid. A technique was developed to study swelling of individual cellulose nanofibrils (CNFs) using AFM. As a case study, CNFs with different degrees of crystallinity (DoC) were examined for swellability going from dry to wet (submerged in de-ionized water). Swelling was found to depend on DoC, but no significant correlation between fibril diameter and swellability was seen. Upon introduction of de-ionized water high DoC samples ($$65\pm 2\%$$ 65 ± 2 % ) were found to have a diameter increase of 34% on average, whereas low DoC ($$44\pm 2\%$$ 44 ± 2 % ) were found to have a diameter increase of 44% on average. A tested control, consisting of platinum nanowires on silisium, did not swell. Graphic abstract

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