Rapid determination of farinograph parameters of wheat flour using data fusion and a forward interval variable selection algorithm

2017 ◽  
Vol 9 (45) ◽  
pp. 6341-6348 ◽  
Author(s):  
Jia Chen ◽  
Fayin Ye ◽  
Guohua Zhao

A forward interval variable selection algorithm combined with data fusion was developed to determine farinograph parameters of wheat flour.

2013 ◽  
Vol 2013 ◽  
pp. 1-8 ◽  
Author(s):  
Xiyuan Chen ◽  
Chong Shen ◽  
Yuefang Zhao

Any vehicle such as vessel has three attitude parameters, which are mostly defined as pitch, roll, and heading from true north. In hydrographic surveying, determination of these parameters by using GPS or INS technologies is essential for the requirements of vehicle measurements. Recently, integration of GPS/INS by using data fusion algorithm became more and more popular. Therefore, the data fusion algorithm plays an important role in vehicle attitude determination. To improve attitude determination accuracy and efficiency, two improved data fusion algorithms are presented, which are extended Kalman particle filter (EKPF) and genetic particle filter (GPF). EKPF algorithm combines particle filter (PF) with the extended Kalman filter (EKF) to avoid sample impoverishment during the resampling process. GPF is based on genetic algorithm and PF; several genetic operators such as selection, crossover, and mutation are adopted to optimize the resampling process of PF, which can not only reduce the particle impoverishment but also improve the computation efficiency. The performances of the system based on the two proposed algorithms are analyzed and compared with traditional KF. Simulation results show that, comprehensively considering the determination accuracy and consumption cost, the performance of the proposed GPF is better than EKPF and traditional KF.


Author(s):  
T. Y. Tan ◽  
W. K. Tice

In studying ion implanted semiconductors and fast neutron irradiated metals, the need for characterizing small dislocation loops having diameters of a few hundred angstrom units usually arises. The weak beam imaging method is a powerful technique for analyzing these loops. Because of the large reduction in stacking fault (SF) fringe spacing at large sg, this method allows for a rapid determination of whether the loop is faulted, and, hence, whether it is a perfect or a Frank partial loop. This method was first used by Bicknell to image small faulted loops in boron implanted silicon. He explained the fringe spacing by kinematical theory, i.e., ≃l/(Sg) in the fault fringe in depth oscillation. The fault image contrast formation mechanism is, however, really more complicated.


2020 ◽  
Vol 29 (9) ◽  
pp. 47-49
Author(s):  
E.B. Barabashov ◽  
◽  
L.A. Revina ◽  
E.I. Ponomareva ◽  
S.I. Lukina ◽  
...  
Keyword(s):  

2017 ◽  
Vol 45 (2) ◽  
pp. 455-464
Author(s):  
T.T. Xue ◽  
J. Liu ◽  
Y.B. Shen ◽  
G.Q. Liu

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