Near full light absorption and full charge collection in 1-micron thick quantum dot photodetector using intercalated graphene monolayer electrodes

Nanoscale ◽  
2020 ◽  
Vol 12 (8) ◽  
pp. 4909-4915 ◽  
Author(s):  
Wenjun Chen ◽  
Seungbae Ahn ◽  
Marquez Balingit ◽  
Jiaying Wang ◽  
Malcolm Lockett ◽  
...  
Keyword(s):  
Quantum Dot ◽  
Light Absorption ◽  
Collection Efficiency ◽  
Charge Collection ◽  
Graphene Monolayer ◽  
Charge Collection Efficiency ◽  
High Charge ◽  
Full Charge

High charge collection efficiency in Vis and NIR using intercalated QD/Gr systems.

scholarly journals Low Voltage High-Energy α-Particle Detectors by GaN-on-GaN Schottky Diodes with Record-High Charge Collection Efficiency

Sensors ◽  
2019 ◽  
Vol 19 (23) ◽  
pp. 5107 ◽  
Author(s):  
Sandupatla ◽  
Arulkumaran ◽  
Ranjan ◽  
Ing ◽  
Murmu ◽  
...  
Keyword(s):  
Low Voltage ◽  
Collection Efficiency ◽  
Schottky Diodes ◽  
High Energy ◽  
Charge Collection ◽  
Charge Carrier Density ◽  
Free Standing ◽  
Charge Collection Efficiency ◽  
High Charge ◽  
Drift Layer

A low voltage (–20 V) operating high-energy (5.48 MeV) α-particle detector with a high charge collection efficiency (CCE) of approximately 65% was observed from the compensated (7.7 × 1014 /cm3) metalorganic vapor phase epitaxy (MOVPE) grown 15 µm thick drift layer gallium nitride (GaN) Schottky diodes on free-standing n+-GaN substrate. The observed CCE was 30% higher than the bulk GaN (400 µm)-based Schottky barrier diodes (SBD) at –20 V. This is the first report of α–particle detection at 5.48 MeV with a high CCE at –20 V operation. In addition, the detectors also exhibited a three-times smaller variation in CCE (0.12 %/V) with a change in bias conditions from –120 V to –20 V. The dramatic reduction in CCE variation with voltage and improved CCE was a result of the reduced charge carrier density (CCD) due to the compensation by Mg in the grown drift layer (DL), which resulted in the increased depletion width (DW) of the fabricated GaN SBDs. The SBDs also reached a CCE of approximately 96.7% at –300 V.

Hybrid Surface Passivation for Retrieving Charge Collection Efficiency of Colloidal Quantum Dot Photovoltaics

2020 ◽  
Vol 12 (39) ◽  
pp. 43576-43585
Author(s):  
Jonghee Yang ◽  
Jae Taek Oh ◽  
Minseon Kim ◽  
Hochan Song ◽  
Danil W. Boukhvalov ◽  
...  
Keyword(s):  
Quantum Dot ◽  
Surface Passivation ◽  
Collection Efficiency ◽  
Charge Collection ◽  
Charge Collection Efficiency ◽  
Colloidal Quantum Dot

Titanium oxide morphology controls charge collection efficiency in quantum dot solar cells

2017 ◽  
Vol 19 (6) ◽  
pp. 4607-4617 ◽  
Author(s):  
Ankita Kolay ◽  
P. Naresh Kumar ◽  
Sarode Krishna Kumar ◽  
Melepurath Deepa
Keyword(s):  
Quantum Dot ◽  
Collection Efficiency ◽  
Current Collector ◽  
Transport Layer ◽  
Electron Transport Layer ◽  
Charge Collection ◽  
Charge Collection Efficiency ◽  
Interface Charge ◽  
Quantum Dot Solar Cells ◽  
Back Electron Transfer

Charge transfer at the TiO2/quantum dot (QD) interface, charge collection at the TiO2/QD/current collector (FTO or SnO2:F) interface, and back electron transfer at the TiO2/QDs/S2− interface are processes controlled by the electron transport layer or TiO2.

Nanowire-quantum-dot solar cells and the influence of nanowire length on the charge collection efficiency

2009 ◽  
Vol 95 (19) ◽  
pp. 193103 ◽  
Author(s):  
Kurtis S. Leschkies ◽  
Alan G. Jacobs ◽  
David J. Norris ◽  
Eray S. Aydil
Keyword(s):  
Solar Cells ◽  
Quantum Dot ◽  
Collection Efficiency ◽  
Charge Collection ◽  
Charge Collection Efficiency ◽  
Quantum Dot Solar Cells

Thin CVD diamond detectors with high charge collection efficiency

2002 ◽  
Vol 49 (1) ◽  
pp. 277-280 ◽  
Author(s):  
A. Brambilla ◽  
D. Tromson ◽  
P. Bergonzo ◽  
C. Mer ◽  
F. Foulon
Keyword(s):  
Collection Efficiency ◽  
Cvd Diamond ◽  
Charge Collection ◽  
Charge Collection Efficiency ◽  
High Charge

3D imaging of radiation damage in silicon sensor and spatial mapping of charge collection efficiency

2013 ◽  
Vol 8 (03) ◽  
pp. C03023-C03023 ◽  
Author(s):  
M Jakubek ◽  
J Jakubek ◽  
J Zemlicka ◽  
M Platkevic ◽  
V Havranek ◽  
...  
Keyword(s):  
Radiation Damage ◽  
3D Imaging ◽  
Collection Efficiency ◽  
Charge Collection ◽  
Spatial Mapping ◽  
Charge Collection Efficiency ◽  
Silicon Sensor
Sign in / Sign up

Export Citation Format

Share Document