Ultrafast nonlinear sub-wavelength solid immersion spectroscopy at T = 8 K: an alternative to nonlinear scanning near-field optical microscopy

1999 ◽  
Vol 194 (2-3) ◽  
pp. 523-527 ◽  
Author(s):  
Vollmer ◽  
Giessen ◽  
Stolz ◽  
Ruhle ◽  
Knorr ◽  
...  
1999 ◽  
Vol 5 (S2) ◽  
pp. 976-977
Author(s):  
M. Raval ◽  
D. Klenerman ◽  
T. Rayment ◽  
Y. Korchev ◽  
M. Lab

It is important to be able to image biological samples in a manner that is non-invasive and allows the sample to retain its functionality during imaging.A member of the SPM (scanning probe microscopy) family, SNOM (scanning near-field optical microscopy), has emerged as a technique that allows optical and topographic imaging of biological samples whilst satisfying the above stated criteria. The basic operating principle of SNOM is as follows. Light is coupled down a fibre-optic probe with an output aperture of sub-wavelength dimensions. The probe is then scanned over the sample surface from a distance that is approximately equal to the size of its aperture. By this apparently simple arrangement, the diffraction limit posed by conventional optical microscopy is overcome and simultaneous generation of optical and topographic images of sub-wavelength resolution is made possible. Spatial resolution values of lOOnm in air and 60nm in liquid[1,2] are achievable with SNOM.


1999 ◽  
Vol 588 ◽  
Author(s):  
Charles Paulson ◽  
Brian Hawkins ◽  
Jingxi Sun ◽  
Arthur B. Ellis ◽  
Leon Mccaughan ◽  
...  

AbstractA novel Near-field Scanning Optical Microscopy (NSOM) technique is used to obtain simultaneous topology, photoluminescence and photoreflectance (PR) spectra. PR spectra from GaAs surfaces were obtained and the local electric fields were calculated. Sub-wavelength resolution is expected for this technique and achieved for PL and topology measurements. Photovoltages, resulting from the high intensity of light at the NSOM tip, can limit the spatial resolution of the electric field determination.


2021 ◽  
Author(s):  
Kobi Frischwasser ◽  
Kobi Cohen ◽  
Jakob Kher-Alden ◽  
Shimon Dolev ◽  
Shai Tsesses ◽  
...  

2000 ◽  
Vol 138 ◽  
pp. 173-174 ◽  
Author(s):  
Hiroaki Nakamura ◽  
Keiji Sawada ◽  
Hirotomo Kambe ◽  
Toshiharu Saiki ◽  
Tetsuya Sato

ChemPhysChem ◽  
2011 ◽  
Vol 13 (4) ◽  
pp. 927-929 ◽  
Author(s):  
Miriam Böhmler ◽  
Achim Hartschuh

APL Photonics ◽  
2021 ◽  
Vol 6 (3) ◽  
pp. 036102
Author(s):  
Tobias Nörenberg ◽  
Lukas Wehmeier ◽  
Denny Lang ◽  
Susanne C. Kehr ◽  
Lukas M. Eng

1995 ◽  
Vol 61 (1-4) ◽  
pp. 155-163 ◽  
Author(s):  
Maria Garcia-Parajo ◽  
Tom Tate ◽  
Yong Chen

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