Development of a Combined Scanning Ion-Conductance and Nearfield Optical Microscope to Image Living Cells

1999 ◽  
Vol 5 (S2) ◽  
pp. 976-977
Author(s):  
M. Raval ◽  
D. Klenerman ◽  
T. Rayment ◽  
Y. Korchev ◽  
M. Lab
Keyword(s):  
Optical Microscopy ◽  
Biological Samples ◽  
Near Field ◽  
Sample Surface ◽  
Optical Microscope ◽  
Ion Conductance ◽  
Simultaneous Generation ◽  
Simple Arrangement ◽  
Wavelength Resolution ◽  
Sub Wavelength

It is important to be able to image biological samples in a manner that is non-invasive and allows the sample to retain its functionality during imaging.A member of the SPM (scanning probe microscopy) family, SNOM (scanning near-field optical microscopy), has emerged as a technique that allows optical and topographic imaging of biological samples whilst satisfying the above stated criteria. The basic operating principle of SNOM is as follows. Light is coupled down a fibre-optic probe with an output aperture of sub-wavelength dimensions. The probe is then scanned over the sample surface from a distance that is approximately equal to the size of its aperture. By this apparently simple arrangement, the diffraction limit posed by conventional optical microscopy is overcome and simultaneous generation of optical and topographic images of sub-wavelength resolution is made possible. Spatial resolution values of lOOnm in air and 60nm in liquid[1,2] are achievable with SNOM.

Study of Hot Spots Probing Based on Meta-Pillars Array

2019 ◽  
Vol 16 (9) ◽  
pp. 3692-3697
Author(s):  
Yisha You ◽  
Fujuan Huang ◽  
Yongqi Fu ◽  
Shaoli Zhu
Keyword(s):  
Hot Spots ◽  
Near Field ◽  
Optical Microscope ◽  
Microscopic Imaging ◽  
Secondary Sources ◽  
Imaging Application ◽  
Calculation Results ◽  
Wavelength Resolution ◽  
Near Field Scanning ◽  
Sub Wavelength

Inspired by imaging principle of near-field scanning optical microscope (NSOM), meta-pillars array is designed and analyzed on the basis of microscopic imaging application with high resolution. Finely focused spots acting as tiny secondary sources for illumination at near-field can be derived under supporting of the meta-pillars for the purpose of increasing imaging resolution. Numerical calculation is carried out on the basis of finite difference and time domain (FDTD) algorithm. Our calculation results demonstrate that the meta-pillars are capable of supporting the microscopic imaging at sub-wavelength resolution.

Photoreflectance Near-Field Scanning Optical Microscopy

1999 ◽  
Vol 588 ◽  
Author(s):  
Charles Paulson ◽  
Brian Hawkins ◽  
Jingxi Sun ◽  
Arthur B. Ellis ◽  
Leon Mccaughan ◽  
...  
Keyword(s):  
Optical Microscopy ◽  
Electric Fields ◽  
Spatial Resolution ◽  
High Intensity ◽  
Near Field ◽  
And Topology ◽  
Wavelength Resolution ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning ◽  
Sub Wavelength

AbstractA novel Near-field Scanning Optical Microscopy (NSOM) technique is used to obtain simultaneous topology, photoluminescence and photoreflectance (PR) spectra. PR spectra from GaAs surfaces were obtained and the local electric fields were calculated. Sub-wavelength resolution is expected for this technique and achieved for PL and topology measurements. Photovoltages, resulting from the high intensity of light at the NSOM tip, can limit the spatial resolution of the electric field determination.

MAPPING OF QUANTUM-HALL EDGE CHANNELS BY A DILUTION-REFRIGERATOR BASED NEAR-FIELD SCANNING OPTICAL MICROSCOPE

2010 ◽  
Vol 19 (04) ◽  
pp. 563-569
Author(s):  
H. ITO ◽  
K. FURUYA ◽  
Y. SHIBATA ◽  
Y. OOTUKA ◽  
S. NOMURA ◽  
...  
Keyword(s):  
Chemical Potential ◽  
Near Field ◽  
Quantum Hall ◽  
Sample Surface ◽  
Optical Microscope ◽  
Optical Probe ◽  
Real Space ◽  
Dilution Refrigerator ◽  
Dimensional Electron Gas ◽  
Near Field Scanning

A real-space mapping of photovoltage near the edge of the Hall-bar of a GaAs/AlGaAs single heterojunction has been obtained using a dilution-refrigerator-based near-field scanning optical microscope in magnetic fields. The optical probe-sample surface distance dependence of photovoltage is investigated. We obtain photovoltage profile in the vicinity of the edge, which reflects the local chemical potential of the two-dimensional electron gas determined by the distribution of the compressible and incompressible strips.

Enhancement of Optical Transmission Through Planar Nano-Apertures in a Metal Film

2003 ◽  
Author(s):  
Eric X. Jin ◽  
Xianfan Xu
Keyword(s):  
Metal Film ◽  
Incident Light ◽  
Near Field ◽  
Transmission Efficiency ◽  
Localized Surface Plasmon ◽  
Fabry Perot ◽  
Wavelength Resolution ◽  
Signal Contrast ◽  
Negative Role ◽  
Sub Wavelength

In this work, we investigate transmission enhancement through ridged-apertures of nanometer size in a metal film in the optical frequency range. It is demonstrated that the fundamental propagation TE10 mode concentrated in the gap between the two ridges of the aperture provides transmission efficiency higher than unity, and the size of the gap between the two ridges determines the sub-wavelength resolution. Fabry-Perot-like resonance with respect to the thickness of the aperture and the red-shift phenomena with respect to the wavelength of the incident light are observed. As a comparison, transmission through regular apertures is also computed, and is found much lower. Localized surface plasmon (LSP) is excited on the edges of the aperture in a silver film but plays a negative role with respect to the field concentration and signal contrast. With optimized geometries, the ridged apertures are capable of achieving sub-wavelength resolution in the near field with transmission efficiency above unity and high contrast.

Tapping Mode Near-Field Scanning Optical Microscopy of Molecular Crystals and Thin Films

1999 ◽  
Vol 5 (S2) ◽  
pp. 994-995
Author(s):  
C. Daniel Frisbie ◽  
Andrey Kosterin ◽  
Helena Stadniychuk
Keyword(s):  
Optical Microscopy ◽  
Spatial Resolution ◽  
Laser Light ◽  
Near Field ◽  
Sample Surface ◽  
Reflected Light ◽  
Surface Laser ◽  
Scanning Optical Microscopy ◽  
Diffraction Effects ◽  
Near Field Scanning

The diffraction of visible light limits the spatial resolution in conventional optical microscopy to about 200-300 nm. In near-field scanning optical microscopy (NSOM), resolution is improved by bringing the light source, such as the end of an optical fiber, very close to the sample surface. Laser light coupled into the opposite end of the fiber propagates down the fiber core and is emitted from the aperture of the tip. When the sample is in the near-field(roughly within one tip diameter of the end of the tip), the spatial resolution is essentially equal to the diameter of the aperture at the end of the tip and is not determined by diffraction effects. Two-dimensional imaging is accomplished by raster-scanning the sample underneath the fiber tip and collecting transmitted or reflected light at a photodetector.

The scanning ion conductance microscope for cellular physiology

2013 ◽  
Vol 304 (1) ◽  
pp. H1-H11 ◽  
Author(s):  
Max J. Lab ◽  
Anamika Bhargava ◽  
Peter T. Wright ◽  
Julia Gorelik
Keyword(s):  
Feedback Control ◽  
Biological Samples ◽  
Three Dimensional ◽  
Sample Surface ◽  
Piezo Actuator ◽  
Ion Conductance ◽  
Functional Capabilities ◽  
Atomic Force ◽  
Pipette Tip ◽  
Near Future

The quest for nonoptical imaging methods that can surmount light diffraction limits resulted in the development of scanning probe microscopes. However, most of the existing methods are not quite suitable for studying biological samples. The scanning ion conductance microscope (SICM) bridges the gap between the resolution capabilities of atomic force microscope and scanning electron microscope and functional capabilities of conventional light microscope. A nanopipette mounted on a three-axis piezo-actuator, scans a sample of interest and ion current is measured between the pipette tip and the sample. The feedback control system always keeps a certain distance between the sample and the pipette so the pipette never touches the sample. At the same time pipette movement is recorded and this generates a three-dimensional topographical image of the sample surface. SICM represents an alternative to conventional high-resolution microscopy, especially in imaging topography of live biological samples. In addition, the nanopipette probe provides a host of added modalities, for example using the same pipette and feedback control for efficient approach and seal with the cell membrane for ion channel recording. SICM can be combined in one instrument with optical and fluorescent methods and allows drawing structure-function correlations. It can also be used for precise mechanical force measurements as well as vehicle to apply pressure with precision. This can be done on living cells and tissues for prolonged periods of time without them loosing viability. The SICM is a multifunctional instrument, and it is maturing rapidly and will open even more possibilities in the near future.

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