ScienceGate
Advanced Search
Author Search
Journal Finder
Blog
Sign in / Sign up
ScienceGate
Search
Author Search
Journal Finder
Blog
Sign in / Sign up
An analysis of low power testing using K ‐means clustering with reordering approach
Electronics Letters
◽
10.1049/ell2.12210
◽
2021
◽
Author(s):
Poornimasre Jegannathan
◽
Harikumar Rajaguru
Keyword(s):
Low Power
◽
Low Power Testing
◽
Power Testing
Download Full-text
Related Documents
Cited By
References
Low Power Testing based on MOS Design Modified Flip-Flop
Indian Journal of Science and Technology
◽
10.17485/ijst/2016/v9i29/91653
◽
2016
◽
Vol 9
(29)
◽
Author(s):
Anjali Chava
◽
S. Saravanan
Keyword(s):
Low Power
◽
Flip Flop
◽
Low Power Testing
◽
Power Testing
Download Full-text
Low power testing - What can commercial DFT tools provide?
2011 International Green Computing Conference and Workshops
◽
10.1109/igcc.2011.6008609
◽
2011
◽
Author(s):
Xijiang Lin
Keyword(s):
Low Power
◽
Low Power Testing
◽
Power Testing
Download Full-text
A new BIST structure for low power testing
2003 5th International Conference on ASIC Proceedings (IEEE Cat No 03TH8690) ICASIC-03
◽
10.1109/icasic.2003.1277425
◽
2003
◽
Cited By ~ 3
Author(s):
Li Jie
◽
Yang Jun
◽
Li Rui
◽
Wang Chao
Keyword(s):
Low Power
◽
Low Power Testing
◽
Power Testing
Download Full-text
An efficient test vector ordering method for low power testing
IEEE Computer Society Annual Symposium on VLSI
◽
10.1109/isvlsi.2004.1339559
◽
2004
◽
Cited By ~ 5
Author(s):
X. Kavousianos
◽
D. Bakalis
◽
M. Bellos
◽
D. Nikolos
Keyword(s):
Low Power
◽
Test Vector
◽
Low Power Testing
◽
Efficient Test
◽
Power Testing
Download Full-text
Is Low Power Testing Necessary? What does the Test Industry Truly Need?
2009 Asian Test Symposium
◽
10.1109/ats.2009.91
◽
2009
◽
Author(s):
Anis Uzzaman
Keyword(s):
Low Power
◽
Low Power Testing
◽
Power Testing
Download Full-text
Low power testing using re-configurable Johnson counter and scalable SIC counter
2015 International Conference on Communications and Signal Processing (ICCSP)
◽
10.1109/iccsp.2015.7322754
◽
2015
◽
Author(s):
Pallavi Margade
Keyword(s):
Low Power
◽
Low Power Testing
◽
Power Testing
Download Full-text
ISC: Reconfigurable Scan-Cell Architecture for Low Power Testing
14th Asian Test Symposium (ATS'05)
◽
10.1109/ats.2005.72
◽
2005
◽
Author(s):
H. Esmaeilzadeh
◽
S. Shamshiri
◽
P. Saeedi
◽
Z. Navabi
Keyword(s):
Low Power
◽
Low Power Testing
◽
Cell Architecture
◽
Power Testing
Download Full-text
Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing
IET Computers & Digital Techniques
◽
10.1049/iet-cdt:20060114
◽
2007
◽
Vol 1
(4)
◽
pp. 369
◽
Cited By ~ 7
Author(s):
M.-H. Yang
◽
Y. Kim
◽
Y. Park
◽
D. Lee
◽
S. Kang
Keyword(s):
Low Power
◽
Shift Register
◽
Linear Feedback Shift Register
◽
Linear Feedback
◽
Low Power Testing
◽
Feedback Shift Register
◽
Self Test
◽
Built In Self Test
◽
Power Testing
Download Full-text
Comprehensive study of the operating and testing experience during the startup and initial operation at the Fort St. Vrain HTGR. Phase 2. Core loading, physics, and low power testing
10.2172/5027135
◽
1978
◽
Author(s):
K. R. Van Howe
◽
M. H. Raudenbush
Keyword(s):
Low Power
◽
Phase 2
◽
Initial Operation
◽
Low Power Testing
◽
Power Testing
◽
Comprehensive Study
Download Full-text
Wrapper Scan Chains Design for Rapid and Low Power Testing of Embedded Cores
IEICE Transactions on Information and Systems
◽
10.1093/ietisy/e88-d.9.2126
◽
2005
◽
Vol E88-D
(9)
◽
pp. 2126-2134
◽
Cited By ~ 3
Author(s):
Y. HAN
Keyword(s):
Low Power
◽
Low Power Testing
◽
Embedded Cores
◽
Scan Chains
◽
Power Testing
Download Full-text
Sign in / Sign up
Close
Export Citation Format
Close
Share Document
Close