Surface potential determination in MOS transistors combining current-voltage and spectroscopic charge pumping

2001 ◽  
Author(s):  
M. Kahouadji
Keyword(s):  
Surface Potential ◽  
Mos Transistors ◽  
Charge Pumping ◽  
Current Voltage

Surface potential determination in irradiated MOS transistors combining current-voltage and charge pumping measurements

1998 ◽  
Vol 45 (3) ◽  
pp. 1355-1364 ◽  
Author(s):  
P. Masson ◽  
J.L. Autran ◽  
C. Raynaud ◽  
O. Flament ◽  
P. Paillet ◽  
...  
Keyword(s):  
Surface Potential ◽  
Mos Transistors ◽  
Charge Pumping ◽  
Current Voltage

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation

Spectroscopic charge pumping: A new procedure for measuring interface trap distributions on MOS transistors

1991 ◽  
Vol 38 (8) ◽  
pp. 1820-1831 ◽  
Author(s):  
G. Van den bosch ◽  
G.V. Groeseneken ◽  
P. Heremans ◽  
H.E. Maes
Keyword(s):  
Interface Trap ◽  
Mos Transistors ◽  
Charge Pumping

A discussion of current-voltage and surface potential measurements to test stress grading materials

1998 ◽  
Vol 31 (19) ◽  
pp. 2612-2621 ◽  
Author(s):  
J Rivenc ◽  
T Lebey ◽  
A Loubière ◽  
M Biron ◽  
J Warnant
Keyword(s):  
Surface Potential ◽  
Current Voltage ◽  
Surface Potential Measurements ◽  
Test Stress

Charge Pumping Memory with SOS-MOS Transistors

1980 ◽  
Vol 19 (S1) ◽  
pp. 155
Author(s):  
Nobuo Sasaki ◽  
Motoo Nakano ◽  
Takashi Iwai
Keyword(s):  
Mos Transistors ◽  
Charge Pumping

scholarly journals A reliable approach to charge-pumping measurements in MOS transistors

1984 ◽  
Vol 31 (1) ◽  
pp. 42-53 ◽  
Author(s):  
G. Groeseneken ◽  
H.E. Maes ◽  
N. Beltran ◽  
R.F. De Keersmaecker
Keyword(s):  
Mos Transistors ◽  
Charge Pumping

Three-level charge pumping on submicronic MOS transistors

1992 ◽  
Vol 84 (6) ◽  
pp. 607-611 ◽  
Author(s):  
J.L. Autran ◽  
F. Djahli ◽  
B. Balland ◽  
C. Plossu ◽  
L.M. Gaborieau
Keyword(s):  
Mos Transistors ◽  
Charge Pumping

Radiation-induced interface traps in hardened MOS transistors: an improved charge-pumping study

1996 ◽  
Vol 43 (6) ◽  
pp. 2547-2557 ◽  
Author(s):  
J.L. Autran ◽  
C. Chabrerie ◽  
P. Paillet ◽  
O. Flament ◽  
J.L. Leray ◽  
...  
Keyword(s):  
Interface Traps ◽  
Mos Transistors ◽  
Charge Pumping ◽  
Radiation Induced
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