A COMPUTER CONTROLLED SCANNING PROBE-HOLE FIELD EMISSION MICROSCOPE

1988 ◽  
Vol 49 (C6) ◽  
pp. C6-43-C6-48 ◽  
Author(s):  
R. M. WOLF ◽  
J. W. BAKKER ◽  
B. E. NIEUWENHUYS
Keyword(s):  
Field Emission ◽  
Scanning Probe ◽  
Computer Controlled ◽  
Probe Hole

Design and performance of a scanning probe-hole field emission microscope

1991 ◽  
Vol 246 (1-3) ◽  
pp. 420-427 ◽  
Author(s):  
R.M. Wolf ◽  
J.W. Bakker ◽  
B.E. Nieuwenhuys
Keyword(s):  
Field Emission ◽  
Scanning Probe ◽  
And Performance ◽  
Probe Hole

Design and performance of a scanning probe-hole field emission microscope

1990 ◽  
Vol 246 (1-3) ◽  
pp. A180
Author(s):  
R.M. Wolf ◽  
J.W. Bakker ◽  
B.E. Nieuwenhuys
Keyword(s):  
Field Emission ◽  
Scanning Probe ◽  
And Performance ◽  
Probe Hole

Field-emission scanning probe lithography tool for 150 mm wafer

2018 ◽  
Vol 36 (6) ◽  
pp. 06JL06 ◽  
Author(s):  
Mathias Holz ◽  
Elshad Guliyev ◽  
Ahmad Ahmad ◽  
Tzvetan Ivanov ◽  
Alexander Reum ◽  
...  
Keyword(s):  
Field Emission ◽  
Scanning Probe ◽  
Scanning Probe Lithography

Room-temperature single dopant atom quantum dot transistors in silicon, formed by field-emission scanning probe lithography

2018 ◽  
Vol 124 (14) ◽  
pp. 144502 ◽  
Author(s):  
Zahid Durrani ◽  
Mervyn Jones ◽  
Faris Abualnaja ◽  
Chen Wang ◽  
Marcus Kaestner ◽  
...  
Keyword(s):  
Quantum Dot ◽  
Field Emission ◽  
Room Temperature ◽  
Scanning Probe ◽  
Dopant Atom ◽  
Scanning Probe Lithography

Simulation of field emission from volcano-gated tips for scanning probe lithography

2017 ◽  
Vol 177 ◽  
pp. 19-24 ◽  
Author(s):  
Steve Lenk ◽  
Marcus Kaestner ◽  
Claudia Lenk ◽  
Ivo W. Rangelow
Keyword(s):  
Field Emission ◽  
Scanning Probe ◽  
Scanning Probe Lithography

Adsorption studies of iron on tungsten by probe-hole field emission microscopy

1995 ◽  
Vol 87-88 ◽  
pp. 37-44 ◽  
Author(s):  
A.D. Adsool ◽  
Rajiv Pande ◽  
R.B. Sharma ◽  
M.A. More ◽  
D.S. Joag
Keyword(s):  
Field Emission ◽  
Adsorption Studies ◽  
Field Emission Microscopy ◽  
Emission Microscopy ◽  
Probe Hole

Scanning Probe Field Emission Current Measurements on Polycrystalline Diamond Films

2001 ◽  
Vol 78-79 ◽  
pp. 177-182 ◽  
Author(s):  
H. Wakimoto ◽  
H. Tomokage ◽  
Young Do Kim ◽  
W. Choi ◽  
Y. Iseri ◽  
...  
Keyword(s):  
Field Emission ◽  
Diamond Films ◽  
Polycrystalline Diamond ◽  
Scanning Probe ◽  
Emission Current ◽  
Probe Field ◽  
Field Emission Current
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