scholarly journals DETERMINATION OF ELECTRON BEAM CHARGING CONDITIONS OF OXIDES AT LOW ENERGY IN THE LOW DOSE RANGE

1989 ◽  
Vol 50 (C6) ◽  
pp. C6-174-C6-174
Author(s):  
M. VALENZA ◽  
P. GIRARD ◽  
B. PISTOULET
Keyword(s):  
Electron Beam ◽  
Low Dose ◽  
Dose Range ◽  
Low Energy

Characterization of Surface Defect Structure by Low Energy Electron Diffraction

1984 ◽  
Vol 41 ◽  
Author(s):  
J. F. Wendelken ◽  
G. -C. Wang ◽  
J. M. Pimbley ◽  
T. -M. Lu
Keyword(s):  
Electron Beam ◽  
Electron Diffraction ◽  
Surface Defect ◽  
Low Energy ◽  
Experimental Results ◽  
Energy Electron ◽  
Low Energy Electron Diffraction ◽  
Low Energy Electron

AbstractLow energy electron diffraction is a surface sensitive tool which is most widely used for the determination of surface symmetries and equilibrium atomic positions. Experimental and theoretical advances made in the past five years make it possible now to use LEED also for the characterization of a wide variety of surface defect structures. In this paper a variety of experimental results involving analysis of diffracted electron beam shapes as a function of primary electron beam energy, adsorbate coverage, crystal tem-perature and ordering time are presented. These experimental results coupled with kinematic theory, allow the determination of step density, size and shape of reconstruction domains and overlayer islands, island size distribution in an overlayer during growth, and the mode of growth.

The Analysis of Dislocations Using a Symmetry Criterion

1972 ◽  
Vol 30 ◽  
pp. 660-661
Author(s):  
J. C. Ingram ◽  
P. R. Strutt ◽  
Wen-Shian Tzeng
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Displacement Field ◽  
Standard Technique ◽  
Residual Image ◽  
Symmetry Criterion

The invisibility criterion which is the standard technique for determining the nature of dislocations seen in the electron microscope can at times lead to erroneous results or at best cause confusion in many cases since the dislocation can still show a residual image if the term is non-zero, or if the edge and screw displacements are anisotropically coupled, or if the dislocation has a mixed character. The symmetry criterion discussed below can be used in conjunction with and in some cases supersede the invisibility criterion for obtaining a valid determination of the nature of the dislocation.The symmetry criterion is based upon the well-known fact that a dislocation, because of the symmetric nature of its displacement field, can show a symmetric image when the dislocation is correctly oriented with respect to the electron beam.

Enhanced information from biological materials through technological improvements in cryo-electron microscopy

1992 ◽  
Vol 50 (1) ◽  
pp. 788-789
Author(s):  
Marc J.C. de Jong ◽  
Wim M. Busing ◽  
Max T. Otten
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Biological Materials ◽  
Electron Crystallography ◽  
Cryo Electron Microscopy ◽  
Transmission Electron ◽  
The Many ◽  
Technological Improvements ◽  
Beam Damage

Biological materials damage rapidly in the electron beam, limiting the amount of information that can be obtained in the transmission electron microscope. The discovery that observation at cryo temperatures strongly reduces beam damage (in addition to making it unnecessaiy to use chemical fixatives, dehydration agents and stains, which introduce artefacts) has given an important step forward to preserving the ‘live’ situation and makes it possible to study the relation between function, chemical composition and morphology.Among the many cryo-applications, the most challenging is perhaps the determination of the atomic structure. Henderson and co-workers were able to determine the structure of the purple membrane by electron crystallography, providing an understanding of the membrane's working as a proton pump. As far as understood at present, the main stumbling block in achieving high resolution appears to be a random movement of atoms or molecules in the specimen within a fraction of a second after exposure to the electron beam, which destroys the highest-resolution detail sought.

Methylamine vanadate (nanovan) negative stain

1994 ◽  
Vol 52 ◽  
pp. 132-133
Author(s):  
James F. Hainfeld ◽  
Daniel Safer ◽  
Joseph S. Wall ◽  
Martha Simon ◽  
Beth Lin ◽  
...  
Keyword(s):  
Electron Beam ◽  
Low Dose ◽  
Biological Molecules ◽  
Positive Staining ◽  
Signal To Noise ◽  
Negative Stain ◽  
Beam Attenuation ◽  
Coarse Grains ◽  
Lower Contrast

Uranyl and tungstate compounds have found favor as negative stains because of their high scattering power relative to biological molecules. However, other properties, such as specimen preservation, resistance to alterations or crystallization in the electron beam, and signal to noise (S/N) ratio, are also important. It may be that lower density materials may have advantages in these areas. A new negative stain, methylamine vanadate, CH3 NH2.VO3 ("NanoVan"), offers a near physiological pH of 8, similar to phosphotungstate (pH 7) with much smoother background. It is also very stable in the electron beam with minimal granulation at a dose of l04 el / nm2 . The resolution obtainable with vanadate appears to be comparable to uranyl at low dose, but superior at higher dose where uranyl forms coarse grains (see Fig. 1). Problems with uranyl such as unwanted positive staining and need for pH below 4 can be avoided. The lower contrast permits use of thicker stain embedment for better preservation and less flattening without excessive beam attenuation.

Sign in / Sign up

Export Citation Format

Share Document