Response to ‘‘Comment on ‘Investigation of the critical layer thickness in elastically strained InGaAs/GaAlAs quantum wells by photoluminescence and transmission electron miscroscopy’ ’’ [Appl. Phys. Lett.55, 2147 (1989)]
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1991 ◽
Vol 9
(1)
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pp. 123-126
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1992 ◽
Vol 120
(1-4)
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pp. 353-356
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