Investigation of MEVVA ion source for metal ion injection into accelerators at GSI

1994 ◽  
Vol 65 (10) ◽  
pp. 3091-3098 ◽  
Author(s):  
B. H. Wolf ◽  
H. Emig ◽  
D. Rück ◽  
P. Spädtke
Keyword(s):  
Metal Ion ◽  
Ion Source ◽  
Ion Injection

Liquid metal ion source assembly for external ion injection into an electron string ion source (ESIS)

2016 ◽  
Vol 87 (2) ◽  
pp. 02A913
Author(s):  
M. J. Segal ◽  
R. A. Bark ◽  
R. Thomae ◽  
E. E. Donets ◽  
E. D. Donets ◽  
...  
Keyword(s):  
Liquid Metal ◽  
Metal Ion ◽  
Ion Source ◽  
Ion Injection

Liquid metal alloy ion source based metal ion injection into a room-temperature electron beam ion source

2012 ◽  
Vol 83 (2) ◽  
pp. 02A511 ◽  
Author(s):  
A. Thorn ◽  
E. Ritter ◽  
F. Ullmann ◽  
W. Pilz ◽  
L. Bischoff ◽  
...  
Keyword(s):  
Electron Beam ◽  
Liquid Metal ◽  
Metal Ion ◽  
Room Temperature ◽  
Ion Source ◽  
Metal Alloy ◽  
Ion Injection ◽  
Liquid Metal Alloy ◽  
Temperature Electron

Study of a liquid metal ion source for external ion injection into electron-beam ion source

2006 ◽  
Vol 77 (3) ◽  
pp. 03A909 ◽  
Author(s):  
A. Pikin ◽  
J. G. Alessi ◽  
E. N. Beebe ◽  
A. Kponou ◽  
K. Prelec
Keyword(s):  
Electron Beam ◽  
Liquid Metal ◽  
Metal Ion ◽  
Ion Source ◽  
Ion Injection

Aspects of high-resolution imaging with a scanning ion microprobe

1986 ◽  
Vol 44 ◽  
pp. 750-751
Author(s):  
R. Levi-Setti ◽  
J. M. Chabala ◽  
Y. L. Wang
Keyword(s):  
Metal Ion ◽  
Secondary Ion Mass Spectrometry ◽  
Chromatic Aberration ◽  
Ion Source ◽  
Ion Microprobe ◽  
Emission Pattern ◽  
Intrinsic Resolution ◽  
Resolution Imaging ◽  
20 Nm ◽  
Secondary Ion

We have shown the feasibility of 20 nm lateral resolution in both topographic and elemental imaging using probes of this size from a liquid metal ion source (LMIS) scanning ion microprobe (SIM). This performance, which approaches the intrinsic resolution limits of secondary ion mass spectrometry (SIMS), was attained by limiting the size of the beam defining aperture (5μm) to subtend a semiangle at the source of 0.16 mr. The ensuing probe current, in our chromatic-aberration limited optical system, was 1.6 pA with Ga+ or In+ sources. Although unique applications of such low current probes have been demonstrated,) the stringent alignment requirements which they imposed made their routine use impractical. For instance, the occasional tendency of the LMIS to shift its emission pattern caused severe misalignment problems.

A HYDRODYNAMICAL STUDY OF THE INSTABILITY OF A PLANAR LIQUID METAL ION SOURCE (SUMMARY)

1989 ◽  
Vol 50 (C8) ◽  
pp. C8-175-C8-177 ◽  
Author(s):  
N. M. MISKOVSKY ◽  
J. HE ◽  
P. H. CUTLER ◽  
M. CHUNG
Keyword(s):  
Liquid Metal ◽  
Metal Ion ◽  
Ion Source

Metal Ion Source for Ion Implantation System

1972 ◽  
Vol 11 (8) ◽  
pp. 1192-1198 ◽  
Author(s):  
Keizo Shimizu ◽  
Hisazo Kawakatsu ◽  
Koichi Kanaya
Keyword(s):  
Ion Implantation ◽  
Metal Ion ◽  
Ion Source

Gold nanograins deposited from a liquid metal ion source

1997 ◽  
Vol 35 (1-4) ◽  
pp. 349-352 ◽  
Author(s):  
C. Vieu ◽  
J. Gierak ◽  
C. David ◽  
Y. Lagadec ◽  
A. Bourlange ◽  
...  
Keyword(s):  
Liquid Metal ◽  
Metal Ion ◽  
Ion Source

Gallium liquid metal ion source (abstract)

1994 ◽  
Vol 65 (4) ◽  
pp. 1355-1355
Author(s):  
J. T. Tang
Keyword(s):  
Liquid Metal ◽  
Metal Ion ◽  
Ion Source
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