Metal ion injection into metals III. Irradiation system and experimental techniques

The close interplay of theoretical and experimental techniques can facilitate the understanding and rational synthesis of novel inorganic clusters, and here an impressive example is shown for the class of cuboid-shaped polyoxo-12-palladates(ii) with a central metal ion guest.

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Study of a liquid metal ion source for external ion injection into electron-beam ion source

Review of Scientific Instruments ◽

10.1063/1.2166428 ◽

2006 ◽

Vol 77 (3) ◽

pp. 03A909 ◽

Cited By ~ 1

Author(s):

A. Pikin ◽

J. G. Alessi ◽

E. N. Beebe ◽

A. Kponou ◽

K. Prelec

Keyword(s):

Electron Beam ◽

Liquid Metal ◽

Metal Ion ◽

Ion Source ◽

Ion Injection

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Metal ion injection into metals II. Anomalous diffusion in Cu and Zn at room temperature and 77 K

Radiation Effects ◽

10.1080/00337577308234719 ◽

1973 ◽

Vol 18 (1-2) ◽

pp. 65-71 ◽

Cited By ~ 8

Author(s):

H. J. Smith

Keyword(s):

Anomalous Diffusion ◽

Metal Ion ◽

Room Temperature ◽

Ion Injection ◽

Cu And Zn

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Investigation of MEVVA ion source for metal ion injection into accelerators at GSI

Review of Scientific Instruments ◽

10.1063/1.1144759 ◽

1994 ◽

Vol 65 (10) ◽

pp. 3091-3098 ◽

Cited By ~ 25

Author(s):

B. H. Wolf ◽

H. Emig ◽

D. Rück ◽

P. Spädtke

Keyword(s):

Metal Ion ◽

Ion Source ◽

Ion Injection

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Metal ion injection into metals I. trapped amounts, sputtering coefficients and the sputtering model of saturation

Radiation Effects ◽

10.1080/00337577308234718 ◽

1973 ◽

Vol 18 (1-2) ◽

pp. 55-64 ◽

Cited By ~ 14

Author(s):

H. J. Smith

Keyword(s):

Metal Ion ◽

Ion Injection

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Aspects of high-resolution imaging with a scanning ion microprobe

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010014511x ◽

1986 ◽

Vol 44 ◽

pp. 750-751

Author(s):

R. Levi-Setti ◽

J. M. Chabala ◽

Y. L. Wang

Keyword(s):

Metal Ion ◽

Secondary Ion Mass Spectrometry ◽

Chromatic Aberration ◽

Ion Source ◽

Ion Microprobe ◽

Emission Pattern ◽

Intrinsic Resolution ◽

Resolution Imaging ◽

20 Nm ◽

Secondary Ion

We have shown the feasibility of 20 nm lateral resolution in both topographic and elemental imaging using probes of this size from a liquid metal ion source (LMIS) scanning ion microprobe (SIM). This performance, which approaches the intrinsic resolution limits of secondary ion mass spectrometry (SIMS), was attained by limiting the size of the beam defining aperture (5μm) to subtend a semiangle at the source of 0.16 mr. The ensuing probe current, in our chromatic-aberration limited optical system, was 1.6 pA with Ga+ or In+ sources. Although unique applications of such low current probes have been demonstrated,) the stringent alignment requirements which they imposed made their routine use impractical. For instance, the occasional tendency of the LMIS to shift its emission pattern caused severe misalignment problems.

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Scanning ion microscopy images

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010012583x ◽

1987 ◽

Vol 45 ◽

pp. 180-181

Author(s):

R. Levi-Setti ◽

J.M. Chabala ◽

Y.L. Wang

Keyword(s):

Metal Ion ◽

Secondary Emission ◽

Scanning Method ◽

Ion Channeling ◽

Secondary Ions ◽

High Resolution Images ◽

Ion Microscopy ◽

Z Contrast ◽

Focused Beams ◽

Microscopy Images

Finely focused beams extracted from liquid metal ion sources (LMIS) provide a wealth of secondary signals which can be exploited to create high resolution images by the scanning method. The images of scanning ion microscopy (SIM) encompass a variety of contrast mechanisms which we classify into two broad categories: a) Emission contrast and b) Analytical contrast.Emission contrast refers to those mechanisms inherent to the emission of secondaries by solids under ion bombardment. The contrast-carrying signals consist of ion-induced secondary electrons (ISE) and secondary ions (ISI). Both signals exhibit i) topographic emission contrast due to the existence of differential geometric emission and collection effects, ii) crystallographic emission contrast, due to primary ion channeling phenomena and differential oxidation of crystalline surfaces, iii) chemical emission or Z-contrast, related to the dependence of the secondary emission yields on the Z and surface chemical state of the target.

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Freeze-etch TEM of aqueous polymer gel network morphology

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100145327 ◽

1986 ◽

Vol 44 ◽

pp. 796-797

Author(s):

J. A. N. Zasadzinski ◽

R. K. Prud'homme

Keyword(s):

Metal Ion ◽

Polymer Network ◽

Polymer Gels ◽

Polymer Gel ◽

Deformation History ◽

Crosslinked Polymer ◽

Aqueous Polymer ◽

History Of ◽

Gel Network ◽

Network Morphology

The rheological and mechanical properties of crosslinked polymer gels arise from the structure of the gel network. In turn, the structure of the gel network results from: thermodynamically determined interactions between the polymer chain segments, the interactions of the crosslinking metal ion with the polymer, and the deformation history of the network. Interpretations of mechanical and rheological measurements on polymer gels invariably begin with a conceptual model of,the microstructure of the gel network derived from polymer kinetic theory. In the present work, we use freeze-etch replication TEM to image the polymer network morphology of titanium crosslinked hydroxypropyl guars in an attempt to directly relate macroscopic phenomena with network structure.

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