In situ measurement of large piezoelectric displacements in resonant atomic force microscopy

Review of Scientific Instruments ◽

10.1063/1.1145566 ◽

1995 ◽

Vol 66 (4) ◽

pp. 2848-2852 ◽

Author(s):

S. Hudlet ◽

M. Saint Jean ◽

D. Royer ◽

J. Berger ◽

C. Guthmann

Keyword(s):

Atomic Force Microscopy ◽

In Situ Measurement ◽

Force Microscopy ◽

Download Full-text

In Situ Measurement of Solid Electrolyte Interphase Evolution on Silicon Anodes Using Atomic Force Microscopy

Advanced Energy Materials ◽

10.1002/aenm.201600099 ◽

2016 ◽

Vol 6 (12) ◽

pp. 1600099 ◽

Author(s):

Insun Yoon ◽

Daniel P. Abraham ◽

Brett L. Lucht ◽

Allan F. Bower ◽

Pradeep R. Guduru

Keyword(s):

Atomic Force Microscopy ◽

Solid Electrolyte ◽

Solid Electrolyte Interphase ◽

In Situ Measurement ◽

Force Microscopy ◽

Silicon Anodes ◽

Download Full-text

In situ measurement of cell stiffness of Arabidopsis roots growing on a glass micropillar support by atomic force microscopy

Plant Biotechnology ◽

10.5511/plantbiotechnology.20.1016a ◽

2020 ◽

Vol 37 (4) ◽

pp. 417-422

Author(s):

Eri Akita ◽

Yaxiaer Yalikun ◽

Kazunori Okano ◽

Yuki Yamasaki ◽

Misato Ohtani ◽

...

Keyword(s):

Atomic Force Microscopy ◽

In Situ Measurement ◽

Cell Stiffness ◽

Force Microscopy ◽

Download Full-text

In situ measurement of crystal surface dynamics in pure and contaminated solutions by Confocal Microscopy and Atomic Force Microscopy

Crystal Research and Technology ◽

10.1002/crat.201200714 ◽

2013 ◽

Vol 48 (10) ◽

pp. 919-941 ◽

Author(s):

Alexander E. S. Van Driessche ◽

Mike Sleutel

Keyword(s):

Atomic Force Microscopy ◽

Confocal Microscopy ◽

Crystal Surface ◽

In Situ Measurement ◽

Surface Dynamics ◽

Force Microscopy ◽

Download Full-text

In-situ measurement of phospholipid nanodisk adhesion on a solid substrate using neutron reflectometry and atomic force microscopy

Physica B Condensed Matter ◽

10.1016/j.physb.2017.11.066 ◽

2018 ◽

Vol 551 ◽

pp. 222-226 ◽

Author(s):

Norifumi L. Yamada ◽

Michele Sferrazza ◽

So Fujinami

Keyword(s):

Atomic Force Microscopy ◽

Solid Substrate ◽

In Situ Measurement ◽

Neutron Reflectometry ◽

Force Microscopy ◽

Download Full-text

In situ studies of the spiral growth of zinc thiourea sulphate crystals with ethylene diamine tetraacetic acid doped by atomic force microscopy

Crystal Research and Technology ◽

10.1002/crat.201400107 ◽

2014 ◽

Vol 49 (9) ◽

pp. 743-752 ◽

Author(s):

Jie Song ◽

Mingwei Li ◽

Min Cheng ◽

Zhitao Hu ◽

Yachao Cao

Keyword(s):

Atomic Force Microscopy ◽

Ethylene Diamine Tetraacetic Acid ◽

Spiral Growth ◽

Ethylene Diamine ◽

Tetraacetic Acid ◽

Force Microscopy ◽

In Situ Studies ◽

Download Full-text

Atomic force microscopy of in situ deformed nickel thin films

Thin Solid Films ◽

10.1016/s0040-6090(99)00369-7 ◽

1999 ◽

Vol 353 (1-2) ◽

pp. 194-200 ◽

Author(s):

C. Coupeau ◽

J.F. Naud ◽

F. Cleymand ◽

P. Goudeau ◽

J. Grilhé

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Nickel Thin Films ◽

Download Full-text

In Situ Observation of Low‐Power Nano‐Synaptic Response in Graphene Oxide Using Conductive Atomic Force Microscopy

Small ◽

10.1002/smll.202101100 ◽

2021 ◽

pp. 2101100

Author(s):

Fei Hui ◽

Peisong Liu ◽

Stephen A. Hodge ◽

Tian Carey ◽

Chao Wen ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Graphene Oxide ◽

Low Power ◽

In Situ Observation ◽

Synaptic Response ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Download Full-text

In Situ Atomic Force Microscopy of the Reconfiguration of On‐Surface Self‐Assembled DNA‐Nanoparticle Superlattices

Advanced Functional Materials ◽

10.1002/adfm.201806924 ◽

2019 ◽

Vol 29 (10) ◽

pp. 1806924 ◽

Author(s):

Mikhail Shekhirev ◽

Eli Sutter ◽

Peter Sutter

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Self Assembled ◽

Nanoparticle Superlattices

Download Full-text

Use of in-situ atomic force microscopy to monitor the biodegradation of polyhydroxyalkanoates (PHAs)

Macromolecular Symposia ◽

10.1002/1521-3900(200103)167:1<139::aid-masy139>3.0.co;2-m ◽

2001 ◽

Vol 167 (1) ◽

pp. 139-151 ◽

Author(s):

Connie J. Rossini ◽

Justinn F. Arceo ◽

Evan R. McCarney ◽

Brian H. Augustine ◽

Douglas E. Dennis ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Download Full-text

Surface morphology of As-deposited and laser-damaged dielectric mirror coatings studied in-situ by atomic force microscopy

10.1117/12.134889 ◽

1992 ◽

Author(s):

Mark R. Kozlowski ◽

Michael C. Staggs ◽

Mehdi Balooch ◽

Robert J. Tench ◽

Wigbert J. Siekhaus

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Force Microscopy ◽

Dielectric Mirror ◽

Download Full-text