In-situ measurement of phospholipid nanodisk adhesion on a solid substrate using neutron reflectometry and atomic force microscopy

2018 ◽  
Vol 551 ◽  
pp. 222-226 ◽  
Author(s):  
Norifumi L. Yamada ◽  
Michele Sferrazza ◽  
So Fujinami
Keyword(s):  
Atomic Force Microscopy ◽  
Solid Substrate ◽  
In Situ Measurement ◽  
Neutron Reflectometry ◽  
Force Microscopy ◽  
Atomic Force

In Situ Measurement of Solid Electrolyte Interphase Evolution on Silicon Anodes Using Atomic Force Microscopy

2016 ◽  
Vol 6 (12) ◽  
pp. 1600099 ◽  
Author(s):  
Insun Yoon ◽  
Daniel P. Abraham ◽  
Brett L. Lucht ◽  
Allan F. Bower ◽  
Pradeep R. Guduru
Keyword(s):  
Atomic Force Microscopy ◽  
Solid Electrolyte ◽  
Solid Electrolyte Interphase ◽  
In Situ Measurement ◽  
Force Microscopy ◽  
Silicon Anodes ◽  
Atomic Force

In situ measurement of large piezoelectric displacements in resonant atomic force microscopy

1995 ◽  
Vol 66 (4) ◽  
pp. 2848-2852 ◽  
Author(s):  
S. Hudlet ◽  
M. Saint Jean ◽  
D. Royer ◽  
J. Berger ◽  
C. Guthmann
Keyword(s):  
Atomic Force Microscopy ◽  
In Situ Measurement ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals In situ measurement of cell stiffness of Arabidopsis roots growing on a glass micropillar support by atomic force microscopy

2020 ◽  
Vol 37 (4) ◽  
pp. 417-422
Author(s):  
Eri Akita ◽  
Yaxiaer Yalikun ◽  
Kazunori Okano ◽  
Yuki Yamasaki ◽  
Misato Ohtani ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
In Situ Measurement ◽  
Cell Stiffness ◽  
Force Microscopy ◽  
Atomic Force

In Situ Atomic Force Microscopy Imaging of Block Copolymer Micelles Adsorbed on a Solid Substrate

Langmuir ◽  
2003 ◽  
Vol 19 (24) ◽  
pp. 10449-10453 ◽  
Author(s):  
Simon D. Connell ◽  
Stephen Collins ◽  
Johan Fundin ◽  
Zhuo Yang ◽  
Ian W. Hamley
Keyword(s):  
Atomic Force Microscopy ◽  
Block Copolymer ◽  
Solid Substrate ◽  
Microscopy Imaging ◽  
Force Microscopy ◽  
Atomic Force ◽  
Atomic Force Microscopy Imaging ◽  
Block Copolymer Micelles ◽  
Copolymer Micelles

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force
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