Versatile double‐crystal fixed exit monochromator for x‐ray synchrotron radiation

1995 ◽  
Vol 66 (2) ◽  
pp. 1754-1756 ◽  
Author(s):  
Mohan Ramanathan ◽  
Pedro A. Montano
2018 ◽  
Vol 74 (6) ◽  
pp. 673-680 ◽  
Author(s):  
V. G. Kohn

The article reports an accurate theory of X-ray coplanar multiple diffraction for an experimental setup that consists of a generic synchrotron radiation (SR) source, double-crystal monochromator (M) and slit (S). It is called for brevity the theory of X-ray coplanar multiple SRMS diffractometry. The theory takes into account the properties of synchrotron radiation as well as the features of diffraction of radiation in the monochromator crystals and the slit. It is shown that the angular and energy dependence (AED) of the sample reflectivity registered by a detector has the form of a convolution of the AED in the case of the monochromatic plane wave with the instrumental function which describes the angular and energy spectrum of radiation incident on the sample crystal. It is shown that such a scheme allows one to measure the rocking curves close to the case of the monochromatic incident plane wave, but only using the high-order reflections by monochromator crystals. The case of four-beam (220)(331)({\overline {11}}1) diffraction in Si is considered in detail.


2017 ◽  
Vol 24 (4) ◽  
pp. 781-786
Author(s):  
Wenjia Wang ◽  
Xiaoyun Yang ◽  
Guangcai Chang ◽  
Pengfei An ◽  
Kewen Cha ◽  
...  

A method to calibrate and stabilize the incident X-ray energy for anomalous diffraction data collection is provided and has been successfully used at the single-crystal diffraction beamline 1W2B at the Beijing Synchrotron Radiation Facilities. Employing a feedback loop to control the movement of the double-crystal monochromator, this new method enables the incident X-ray energy to be kept within a 0.2 eV range at the inflection point of the absorption edge.


1996 ◽  
Vol 68 (8) ◽  
pp. 1147-1149 ◽  
Author(s):  
Y. Zhuang ◽  
Y. T. Wang ◽  
D. S. Jiang ◽  
X. P. Yang ◽  
X. M. Jiang ◽  
...  

1992 ◽  
Vol 63 (1) ◽  
pp. 1322-1325 ◽  
Author(s):  
M. D. Roper ◽  
P. A. Buksh ◽  
I. W. Kirkman ◽  
G. van der Laan ◽  
H. A. Padmore ◽  
...  

2000 ◽  
Vol 210 (1-3) ◽  
pp. 193-197 ◽  
Author(s):  
R Kumaresan ◽  
R Gopalakrishnan ◽  
S Moorthy Babu ◽  
P Ramasamy ◽  
Peter Zaumseil ◽  
...  

1984 ◽  
Vol 41 ◽  
Author(s):  
S J Barnett ◽  
B K Tanner ◽  
G. T. Brown

AbstractThe high intensity and large beam size of a synchrotron radiation source have been exploited in order to obtain double crystal X-ray topographs of whole 2in. and 3in. slices of semi-insulating LEC GaAs single crystals. Exposure times, typically 30 minutes for high resolution topographs, are at least one order of magnitude down on those required when using a conventional source. Variations in relative lattice parameter and lattice tilt have been measured as a function of position on the slice. The defect structure has been imaged and dislocations are seen in cellular configurations, slip bands and linear arrays (lineage), the latter of which are shown to be associated with small lattice tilts, typically 30”. The defect structure revealed on the topographs has been correlated with 1μm infrared absorption micrographs which are believed to represent the concentration of the dominant deep level EL2.


1988 ◽  
Vol 32 ◽  
pp. 141-147
Author(s):  
Shinjiro Hayakawa ◽  
Atsuo Iida ◽  
Sadao Aoki ◽  
Yohichi Gohshi

AbstractA synchrotron radiation X-ray micro analyzer(SRXMA) was developed at Photon Factory in Japan. The present SRXMA combines a double crystal monochromator and mirror optics and either a white or a monochromatic microbeam can be used. Micro X-ray fluorescence analysis was carried out, and a minimum detection limit of 1 ppm for Mn was obtained for 100 sec measurement with the white beam. With monochromatic beam excitation, micro X-ray spectroscopies are now feasible.The obtained beam size was 1.6 μ;m - 34 μm* The beam was blurred in one direction by the scattered X-rays caused by the surface irregularities of the focusing mirror. Improvements in the mirror quality will ensure a beam spot of just a few microns with sufficient intensity.


1998 ◽  
Vol 5 (3) ◽  
pp. 661-663
Author(s):  
Jaromír Hrdý ◽  
Edoardo Busetto

A rotated-inclined double-crystal X-ray monochromator was designed for high-power undulator beamlines for SPring-8 to reduce the impinging radiation power density. Recently, it has been shown that an inclined double-crystal monochromator suffers from a certain type of geometrical aberration that may be relatively easily compensated. In this paper, it is shown that a similar aberration exists also in the case of rotated-inclined monochromators and that as in the inclined case the aberration may also be compensated.


1998 ◽  
Vol 5 (3) ◽  
pp. 664-666 ◽  
Author(s):  
Tang-Eh Dann ◽  
Shih-Chun Chung ◽  
Liang-Jen Huang ◽  
Jwei-Ming Juang ◽  
Ching-Iue Chen ◽  
...  

A high-performance double-crystal-monochromator soft X-ray (DCMSX) beamline has been constructed at the Synchrotron Radiation Research Center (SRRC). This beamline delivers monochromatic photon beams with energies from 1 to 9 keV and a resolving power (E/ΔE) of up to 7000. This beamline provides users with an opportunity to study many important materials, such as high-Tc superconductors, magnetic materials, catalysts, super-alloy compounds etc. Excellent EXAFS and NEXFS spectra have been routinely obtained from this beamline. Several interesting research projects are currently being conducted at this beamline. All the results show that this beamline has been constructed to meet its design goals.


1988 ◽  
Vol 21 (6) ◽  
pp. 911-915 ◽  
Author(s):  
D. Hohlwein ◽  
D. P. Siddons ◽  
J. B. Hastings

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