Development of a microwave ion source for negative oxygen ion beam production

1995 ◽  
Vol 66 (10) ◽  
pp. 4911-4915 ◽  
Author(s):  
M. Tanaka ◽  
K. Miyake ◽  
N. Sakudo ◽  
K. Kobayashi ◽  
H. Ohkawa
Vacuum ◽  
1988 ◽  
Vol 38 (6) ◽  
pp. 487-490 ◽  
Author(s):  
K Tokiguchi ◽  
K. Amemiya ◽  
H. Koike ◽  
N. Sakudo ◽  
T. Seki

Vacuum ◽  
2016 ◽  
Vol 124 ◽  
pp. 55-59 ◽  
Author(s):  
Narender Kumar ◽  
G. Rodrigues ◽  
Y. Mathur ◽  
S. Ojha ◽  
R. Ahuja ◽  
...  

Shinku ◽  
1999 ◽  
Vol 42 (7) ◽  
pp. 670-675 ◽  
Author(s):  
Takayoshi SEKI ◽  
Katsumi TOKIGUCHI

1991 ◽  
Vol 236 ◽  
Author(s):  
A.I. Stognij ◽  
V.V. Tokarev ◽  
Yu.N. Mitin

AbstractThe paper presents the results of AES, SIMS, RBS and electron microscopy investigation of compound metal oxide films. The films were deposited by sputtering compound targets with oxygen ion beam, extracted from hollow cold cathode ion source.


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