Copper nitride and tin nitride thin films for write‐once optical recording media

Ni-doped copper nitride films have been prepared by co-sputtering of Ni and Cu targets. The addition of Ni to Cu3N films reduced the intensity of the (111) diffraction peak, and lead a little angular shifts of the peaks. The films showed a large difference in reflectance in the infrared and visible before and after thermal decomposition, which is applicable to optical recording media. The films change from a semiconductor to a conductor with the increased ratio of Ni in Cu3N films.

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Optical Properties of Multi-layer Chalcogenide Thin Film for Optical Recording Media

MRS Proceedings ◽

10.1557/proc-803-hh4.7 ◽

2003 ◽

Vol 803 ◽

Author(s):

Myung-Jin Kang ◽

Chan-Gyung Park ◽

Se-Young Choi

Keyword(s):

Thin Film ◽

Thin Films ◽

Optical Properties ◽

Data Storage ◽

Optical Band Gap ◽

Optical Recording ◽

Recording Media ◽

Optical Contrast ◽

The Media ◽

Chalcogenide Thin Film

ABSTRACTWe present the results of optical properties of multi layer thin films as in the media of phase change optical disk data storage. Reflectance and optical contrast of multi layer thin films increased rapidly between 100 °C and 150 °C. Moreover, optical contrasts at different wavelength were also studied. The refractive index and the optical band gap decreased, while the extinction coefficient increases as the crystallization occurs. The Egopt of crystalline thin film was ∼0.6 eV lower than that of amorphous thin film. Egopt decreased as the number of stacked layer increased.

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Optical recording characteristics of tin nitride thin films prepared by an atmospheric pressure halide chemical vapor deposition

Solid State Sciences ◽

10.1016/s1293-2558(03)00051-7 ◽

2003 ◽

Vol 5 (4) ◽

pp. 587-589 ◽

Cited By ~ 7

Author(s):

Naoyuki Takahashi ◽

Masahisa Takekawa ◽

Tadashi Takahashi ◽

Takato Nakamura ◽

Masayuki Yoshioka ◽

...

Keyword(s):

Thin Films ◽

Chemical Vapor Deposition ◽

Vapor Deposition ◽

Atmospheric Pressure ◽

Chemical Vapor ◽

Optical Recording ◽

Tin Nitride

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Optical parameters and absorption of copper (II)-azo complexes thin films as optical recording media

Thin Solid Films ◽

10.1016/j.tsf.2004.12.038 ◽

2005 ◽

Vol 483 (1-2) ◽

pp. 251-256 ◽

Cited By ~ 41

Author(s):

Fuxin Huang ◽

Yiqun Wu ◽

Donghong Gu ◽

Fuxi Gan

Keyword(s):

Thin Films ◽

Optical Recording ◽

Optical Parameters ◽

Recording Media

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Optical properties of nickel(II)–azo complexes thin films for potential application as high-density recordable optical recording media

Solid State Communications ◽

10.1016/j.ssc.2006.09.049 ◽

2007 ◽

Vol 141 (1) ◽

pp. 1-5 ◽

Cited By ~ 7

Author(s):

Zhimin Chen ◽

Yiqun Wu ◽

Fuxin Huang ◽

Donghong Gu ◽

Fuxi Gan

Keyword(s):

Thin Films ◽

Optical Properties ◽

Potential Application ◽

Optical Recording ◽

High Density ◽

Recording Media

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Crystallization Mechanism of Si/Cu100-xZrx Bilayer Film for Write-Once Blue Laser Optical Recording Media

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.123-125.643 ◽

2010 ◽

Vol 123-125 ◽

pp. 643-646

Author(s):

Sin Liang Ou ◽

Po Cheng Kuo ◽

Chih Hsiang Hsiao ◽

Don Yau Chiang ◽

Chao Te Lee ◽

...

Keyword(s):

Thin Films ◽

Optical Property ◽

Magnetron Sputtering ◽

Optical Recording ◽

Crystallization Mechanism ◽

Blue Laser ◽

Bilayer Film ◽

Recording Media ◽

Protective Layers ◽

Bilayer Films

Si/Cu100xZrx (x= 0~38.1) bilayer recording thin films were deposited on nature oxidized silicon wafer, and glass substrate by magnetron sputtering. The ZnS-SiO2 films were used as protective layers. We have studied the thermal property, optical property, and crystallization mechanism of the Si/Cu100-xZrx bilayer thin films. The optical contrasts of the Si/Cu100-xZrx (x= 0~38.1) bilayer films under 405 nm wavelength are all larger than 15%, and it reaches a high value of 40%, as x= 38.1. This indicates that the Si/Cu100-xZrx (x= 0~38.1) bilayer films are suitable for blue laser optical recording.

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Comparative Static Blu-Ray Recording Properties for Three Metal(II) Complexes in Spin-Coated Films

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.239-242.2244 ◽

2011 ◽

Vol 239-242 ◽

pp. 2244-2247

Author(s):

Zhi Min Chen ◽

Yi Qun Wu ◽

Chun Ying He ◽

Bin Wang ◽

Dong Hong Gu ◽

...

Keyword(s):

Thin Films ◽

Spin Coating ◽

Optical Recording ◽

Testing System ◽

Recording Media ◽

Force Microscopy ◽

Reflective Layer ◽

Atomic Force ◽

K9 Glass ◽

Propanol Solution

Smooth thin films of three metal(II) complexes were prepared by spin-coating process from 2,2,3,3- tetrafluoro-1-propanol solution and characterized atomic force microscopy (AFM). In order to examine their possible use as blu-ray recording media, the spin-coated films of the metal(II) complexes on K9 glass substrate with a silver reflective layer were evaluated by static optical recording testing system with a 406.7 nm laser. The morphologies of the thin films are smooth and have a root mean square surface roughness (RMS) of 0.34-0.41 nm with in 5 μ × 5 μ area. The results of the static optical recording test demonstrate that high reflectivity contrast (> 54 %) can be obtained at an optimum laser writing power and pulse width with high-to-low polarity, and the recording marks are durable even after 15000 times readout. In addition, the recording marks on the cobalt (II) complex thin film are very clear and circular, and their size can reach 200 nm or less.

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