X-ray diffraction and Raman scattering study of SrBi2Ta2O9 ceramics and thin films with Bi3TiNbO9 addition

Dysprosium (Dy) ion implanted CdTe polycrystalline thin film (PTF) deposited on the ceramic substrate by the close spaced sublimation （CSS) method. Both the energy dispersive X-ray spectrometer（EDS）and Raman scattering analysis show that the as-deposited and Dy ion implanted CdTe PTF are non-stoichiometric with excess telluride. Furthermore, X-ray diffraction study reveals that the CdTe PTF forms a zinc-blended structure. In the Raman scattering analysis, the position of the peak on implantation does not change apparently whereas the intensity of the peak decreases owing to the lattice damage and increases as a result of thermal annealing. The data support that Raman activity is enhanced after Dy ion implantation.

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Structrual Characterization and Raman Scattering of Epitaxial Aluminum Nitride Thin Films on Si(111)

MRS Proceedings ◽

10.1557/proc-242-469 ◽

1992 ◽

Vol 242 ◽

Cited By ~ 1

Author(s):

W. J. Meng ◽

T. A. Perry ◽

J. Heremans ◽

Y. T. Cheng

Keyword(s):

Thin Films ◽

Aluminum Nitride ◽

Raman Scattering ◽

High Vacuum ◽

Ultra High Vacuum ◽

X Ray Diffraction ◽

X Ray ◽

Reactive Sputter Deposition ◽

Transmission Electron ◽

Substrate Temperatures

ABSTRACTThin films of aluminum nitride were grown epitaxially on Si(111) by ultra-high-vacuum dc magnetron reactive sputter deposition. Epitaxy was achieved at substrate temperatures of 600° C or above. We report results of film characterization by x-ray diffraction, transmission electron microscopy, and Raman scattering.

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A combined X-ray diffraction and Raman scattering study of the phase transitions in Sr1−xCaxTiO3 (x=0.04, 0.06, and 0.12)

Journal of Solid State Chemistry ◽

10.1016/j.jssc.2005.06.036 ◽

2005 ◽

Vol 178 (9) ◽

pp. 2846-2857 ◽

Cited By ~ 18

Author(s):

Sanjay Kumar Mishra ◽

Rajeev Ranjan ◽

Dhananjai Pandey ◽

Pierre Ranson ◽

Robert Ouillon ◽

...

Keyword(s):

Phase Transitions ◽

Raman Scattering ◽

X Ray Diffraction ◽

X Ray ◽

Scattering Study

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In situ analysis of the crystallization process of Sb 2 S 3 thin films by Raman scattering and X-ray diffraction

Materials & Design ◽

10.1016/j.matdes.2017.02.034 ◽

2017 ◽

Vol 121 ◽

pp. 1-10 ◽

Cited By ~ 20

Author(s):

Romain Parize ◽

Thomas Cossuet ◽

Odette Chaix-Pluchery ◽

Hervé Roussel ◽

Estelle Appert ◽

...

Keyword(s):

Thin Films ◽

Raman Scattering ◽

Crystallization Process ◽

In Situ Analysis ◽

X Ray Diffraction ◽

X Ray

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Structural Investigation of Copper Phthalocyanine Thin Films Using X-Ray Diffraction, Raman Scattering and Optical Absorption Measurements

physica status solidi (b) ◽

10.1002/1521-3951(200202)229:3<1175::aid-pssb1175>3.0.co;2-k ◽

2002 ◽

Vol 229 (3) ◽

pp. 1175-1186 ◽

Cited By ~ 71

Author(s):

R. Prabakaran ◽

R. Kesavamoorthy ◽

G.L.N. Reddy ◽

F.P. Xavier

Keyword(s):

Thin Films ◽

Optical Absorption ◽

Raman Scattering ◽

Structural Investigation ◽

Copper Phthalocyanine ◽

X Ray Diffraction ◽

X Ray ◽

Absorption Measurements

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Investigations on nitrogen ion implantation effects in vacuum evaporated CdS thin films using Raman scattering and X-ray diffraction studies

Physica B Condensed Matter ◽

10.1016/s0921-4526(01)00341-6 ◽

2001 ◽

Vol 304 (1-4) ◽

pp. 175-180 ◽

Cited By ~ 20

Author(s):

K. Senthil ◽

D. Mangalaraj ◽

Sa.K. Narayandass ◽

R. Kesavamoorthy ◽

G.L.N. Reddy ◽

...

Keyword(s):

Thin Films ◽

Ion Implantation ◽

Raman Scattering ◽

X Ray Diffraction ◽

Nitrogen Ion Implantation ◽

X Ray ◽

Cds Thin Films ◽

Nitrogen Ion

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X-ray diffraction and Raman scattering study of thermal-induced phase transformation in vertically aligned TiO2 nanocrystals grown on sapphire(100) via metal organic vapor deposition

Journal of Crystal Growth ◽

10.1016/j.jcrysgro.2008.05.021 ◽

2008 ◽

Vol 310 (15) ◽

pp. 3663-3667 ◽

Cited By ~ 7

Author(s):

C.A. Chen ◽

K.Y. Chen ◽

Y.S. Huang ◽

D.S. Tsai ◽

K.K. Tiong ◽

...

Keyword(s):

Phase Transformation ◽

Raman Scattering ◽

Vapor Deposition ◽

X Ray Diffraction ◽

Tio2 Nanocrystals ◽

X Ray ◽

Organic Vapor ◽

Metal Organic ◽

Vertically Aligned ◽

Scattering Study

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High-resolution X-ray diffraction and micro-Raman scattering studies of Ge(:Ga) thin films grown on GaAs (001) substrates by MOCVD

RSC Advances ◽

10.1039/c6ra10348k ◽

2016 ◽

Vol 6 (58) ◽

pp. 52575-52582 ◽

Cited By ~ 2

Author(s):

H. F. Liu ◽

Y. J. Jin ◽

C. G. Li ◽

S. B. Dolmanan ◽

S. Guo ◽

...

Keyword(s):

Thin Films ◽

High Resolution ◽

Raman Scattering ◽

Cross Section ◽

X Ray Diffraction ◽

X Ray

Ga-doped Ge thin films grown on GaAs (001) substrates have been studied and compared with unintentionally doped Ge film by using HRXRD and Raman scattering in both surface and cross-section configurations.

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