Atomic level scanning transmission electron microscopy characterization of GaN/AlN quantum wells

2004 ◽  
Vol 96 (1) ◽  
pp. 738-746 ◽  
Author(s):  
K. A. Mkhoyan ◽  
E. J. Kirkland ◽  
J. Silcox ◽  
E. S. Alldredge
2008 ◽  
Vol 47 (7) ◽  
pp. 5330-5332 ◽  
Author(s):  
Satoshi Harui ◽  
Hidetoshi Tamiya ◽  
Takanobu Akagi ◽  
Hideto Miyake ◽  
Kazumasa Hiramatsu ◽  
...  

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