Comparison of the passivation effects on self- and non-self-aligned InP/InGaAs/InP double heterostructure bipolar transistors by low-temperature deposited SiNx
2005 ◽
Vol 49
(3)
◽
pp. 409-412
◽
1995 ◽
Vol 38
(9)
◽
pp. 1703-1709
◽
Base-emitter injection characterization in low-temperature pseudo-heterojunction bipolar transistors
1990 ◽
Vol 37
(10)
◽
pp. 2222-2229
◽
Keyword(s):