Fabrication and characterization of bipolar transistors with in-situ doped low-temperature (800 degrees C) epitaxial silicon

IEEE Electron Device Letters ◽

10.1109/55.31764 ◽

1989 ◽

Vol 10 (8) ◽

pp. 383-385 ◽

Author(s):

S. Ohi ◽

R. Burger ◽

R. Reif

Keyword(s):

Low Temperature ◽

Bipolar Transistors ◽

Epitaxial Silicon ◽

Fabrication And Characterization

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Electrical characterization of junctions and bipolar transistors formed with in situ doped low-temperature (800 degrees C) epitaxial silicon

IEEE Transactions on Electron Devices ◽

10.1109/16.65746 ◽

1991 ◽

Vol 38 (1) ◽

pp. 128-134

Author(s):

S. Ohi ◽

W.R. Burger ◽

R. Reif

Keyword(s):

Low Temperature ◽

Electrical Characterization ◽

Bipolar Transistors ◽

Epitaxial Silicon

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Fabrication and characterization of in situ-doped a-Si0.8C0.2 emitter bipolar transistors

Solid-State Electronics ◽

10.1016/s0038-1101(00)00121-0 ◽

2000 ◽

Vol 44 (9) ◽

pp. 1543-1548 ◽

Author(s):

A Orpella ◽

J Puigdollers ◽

D Bardés ◽

R Alcubilla ◽

L.F Marsal ◽

...

Keyword(s):

Bipolar Transistors ◽

Fabrication And Characterization

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Low Temperature Scanning Electron Microscope for Fabrication and Characterization of High-Tc Josephson Junctions and Circuits

10.21236/ada383240 ◽

2000 ◽

Author(s):

Judy Wu ◽

Siyuan Han

Keyword(s):

Electron Microscope ◽

Low Temperature ◽

Scanning Electron Microscope ◽

Josephson Junctions ◽

High Tc ◽

Fabrication And Characterization ◽

Temperature Scanning ◽

Scanning Electron

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Fabrication and characterization of starch films containing chitosan nanoparticles using in situ precipitation and mechanoactivation techniques

Journal of Food Engineering ◽

10.1016/j.jfoodeng.2021.110593 ◽

2021 ◽

pp. 110593

Author(s):

I.M. Lipatova ◽

A.A. Yusova ◽

L.I. Makarova

Keyword(s):

Chitosan Nanoparticles ◽

Starch Films ◽

Fabrication And Characterization

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Fabrication and characterization of ECTFE hollow fiber membranes via low-temperature thermally induced phase separation (L-TIPS)

Journal of Membrane Science ◽

10.1016/j.memsci.2021.119429 ◽

2021 ◽

pp. 119429

Author(s):

Jian Pan ◽

Wenyi Ma ◽

Lilan Huang ◽

Ruzhe Li ◽

Qinglin Huang ◽

...

Keyword(s):

Phase Separation ◽

Low Temperature ◽

Hollow Fiber ◽

Thermally Induced Phase Separation ◽

Hollow Fiber Membranes ◽

Thermally Induced ◽

Fiber Membranes ◽

Fabrication And Characterization

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Fabrication and characterization of low temperature sintered hard piezoelectric ceramics for multilayer piezoelectric energy harvesters

Ceramics International ◽

10.1016/j.ceramint.2021.02.239 ◽

2021 ◽

Author(s):

Intae Seo ◽

Sora Jo ◽

Dae Su Kim ◽

Hyung-Won Kang ◽

Sahn Nahm ◽

...

Keyword(s):

Low Temperature ◽

Piezoelectric Ceramics ◽

Energy Harvesters ◽

Piezoelectric Energy ◽

Fabrication And Characterization

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Fabrication and Characterization of Low-Temperature Poly-Silicon Lateral p-i-n Diode

IEEE Electron Device Letters ◽

10.1109/led.2010.2043047 ◽

2010 ◽

Vol 31 (5) ◽

pp. 443-445 ◽

Author(s):

Se Hwan Kim ◽

Seung Hoon Lee ◽

Jin Jang

Keyword(s):

Low Temperature ◽

Poly Silicon ◽

Fabrication And Characterization

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In-situ experimental characterization of the clamping pressure effects on low temperature polymer electrolyte membrane electrolysis

International Journal of Hydrogen Energy ◽

10.1016/j.ijhydene.2017.07.059 ◽

2017 ◽

Vol 42 (34) ◽

pp. 21597-21606 ◽

Author(s):

Saher Al Shakhshir ◽

Xiaoti Cui ◽

Steffen Frensch ◽

Søren Knudsen Kær

Keyword(s):

Low Temperature ◽

Polymer Electrolyte ◽

Polymer Electrolyte Membrane ◽

Pressure Effects ◽

Experimental Characterization ◽

Membrane Electrolysis ◽

Electrolyte Membrane ◽

Clamping Pressure

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Fabrication and characterization of metal/insulator/semiconductor structures based on TiO2 and TiO2/SiO2 thin films prepared by low-temperature arc vapor deposition

Electronic Materials Letters ◽

10.1007/s13391-013-3244-6 ◽

2014 ◽

Vol 10 (3) ◽

pp. 579-584 ◽

Author(s):

Kumar Shubham ◽

P. Chakrabarti

Keyword(s):

Low Temperature ◽

Vapor Deposition ◽

Metal Insulator ◽

Metal Insulator Semiconductor ◽

Semiconductor Structures ◽

Fabrication And Characterization

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Fabrication and Characterization of Porous Nickel Membrane for High Precision Gas Filter by In-situ Reduction/Sintering Process

Journal of Korean Powder Metallurgy Institute ◽

10.4150/kpmi.2009.16.4.262 ◽

2009 ◽

Vol 16 (4) ◽

pp. 262-267 ◽

Author(s):

Nam-Hoon Kim ◽

Han-Bok Song ◽

Sung-Churl Choi ◽

Yong-Ho Choa

Keyword(s):

High Precision ◽

In Situ Reduction ◽

Sintering Process ◽

Porous Nickel ◽

Fabrication And Characterization

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