Quantitative extraction of in-plane surface properties using torsional resonance mode of atomic force microscopy

2005 ◽  
Vol 97 (8) ◽  
pp. 083533 ◽  
Author(s):  
Yaxin Song ◽  
Bharat Bhushan
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Properties ◽  
Plane Surface ◽  
Resonance Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Quantitative Extraction

Torsional resonance mode atomic force microscopy in liquid with Lorentz force actuation

2013 ◽  
Vol 24 (30) ◽  
pp. 305702 ◽  
Author(s):  
Chih-Wen Yang ◽  
Ren-Feng Ding ◽  
Shih-Hsiu Lai ◽  
Hsien-Shun Liao ◽  
Wei-Chiao Lai ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Lorentz Force ◽  
Resonance Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

scholarly journals An investigation of surface properties, local elastic modulus and interaction with simulated pulmonary surfactant of surface modified inhalable voriconazole dry powders using atomic force microscopy

RSC Advances ◽  
2016 ◽  
Vol 6 (31) ◽  
pp. 25789-25798 ◽  
Author(s):  
Sumit Arora ◽  
Michael Kappl ◽  
Mehra Haghi ◽  
Paul M. Young ◽  
Daniela Traini ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Elastic Modulus ◽  
Surface Properties ◽  
Pulmonary Surfactant ◽  
Dry Powders ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Modified ◽  
Spray Dried

l-Leucine modified voriconazole spray dried micropartcles.

Surface properties of Aspergillus oryzae spores investigated by atomic force microscopy

2002 ◽  
Vol 24 (3-4) ◽  
pp. 277-284 ◽  
Author(s):  
Bruno C van der Aa ◽  
Marcel Asther ◽  
Yves F Dufrêne
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Properties ◽  
Aspergillus Oryzae ◽  
Force Microscopy ◽  
Atomic Force

Using Atomic Force Microscopy to Retrieve Nanomechanical Surface Properties of Materials

2006 ◽  
Vol 514-516 ◽  
pp. 1598-1602 ◽  
Author(s):  
Sergio Graça ◽  
Rogerio Colaço ◽  
Rui Vilar
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Properties ◽  
Application Rate ◽  
Critical Parameters ◽  
Nanomechanical Property ◽  
Force Microscopy ◽  
Atomic Force ◽  
Properties Of Materials ◽  
Microscopy Techniques ◽  
Scratch Tests

When atomic force microscopy is used to retrieve nanomechanical surface properties of materials, unsuspected measurement and instrumentation errors may occur. In this work, some error sources are investigated and operating and correction procedures are proposed in order to maximize the accuracy of the measurements. Experiments were performed on sapphire, Ni, Co and Ni-30%Co samples. A triangular pyramidal diamond tip was used to perform indentation and scratch tests, as well as for surface visualization. It was found that nonlinearities of the z-piezo scanner, in particular the creep of the z-piezo, and errors in the determination of the real dimensions of tested areas, are critical parameters to be considered. However, it was observed that there is a critical load application rate, above which the influence of the creep of the z-piezo can be neglected. Also, it was observed that deconvolution of the tip geometry from the image of the tested area is essential to obtain accurate values of the dimensions of indentations and scratches. The application of these procedures enables minimizing the errors in nanomechanical property measurements using atomic force microscopy techniques.

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