Evaluation of Surface Properties of Polymeric Materials by Atomic Force Microscopy

2008 ◽  
Vol 81 (9) ◽  
pp. 354-360
Author(s):  
Ken Nakajima ◽  
So Fujinami ◽  
Toshio Nishi
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Properties ◽  
Polymeric Materials ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: A Review

Polymers ◽  
2020 ◽  
Vol 12 (5) ◽  
pp. 1142 ◽  
Author(s):  
Phuong Nguyen-Tri ◽  
Payman Ghassemi ◽  
Pascal Carriere ◽  
Sonil Nanda ◽  
Aymen Amine Assadi ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Chemical Characterization ◽  
Super Resolution ◽  
Polymeric Materials ◽  
Polymer Materials ◽  
Polymer Science ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanoscale Characterization

Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. This paper reviews some recent progress in the application of AFM and AFM-IR in polymer science. We describe the principle of AFM-IR and the recent improvements to enhance its resolution. We also discuss the latest progress in the use of AFM-IR as a super-resolution correlated scanned-probe infrared spectroscopy for the chemical characterization of polymer materials dealing with polymer composites, polymer blends, multilayers, and biopolymers. To highlight the advantages of AFM-IR, we report several results in studying the crystallization of both miscible and immiscible blends as well as polymer aging. Finally, we demonstrate how this novel technique can be used to determine phase separation, spherulitic structure, and crystallization mechanisms at nanoscales, which has never been achieved before. The review also discusses future trends in the use of AFM-IR in polymer materials, especially in polymer thin film investigation.

scholarly journals An investigation of surface properties, local elastic modulus and interaction with simulated pulmonary surfactant of surface modified inhalable voriconazole dry powders using atomic force microscopy

RSC Advances ◽  
2016 ◽  
Vol 6 (31) ◽  
pp. 25789-25798 ◽  
Author(s):  
Sumit Arora ◽  
Michael Kappl ◽  
Mehra Haghi ◽  
Paul M. Young ◽  
Daniela Traini ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Elastic Modulus ◽  
Surface Properties ◽  
Pulmonary Surfactant ◽  
Dry Powders ◽  
Force Microscopy ◽  
Atomic Force ◽  
Surface Modified ◽  
Spray Dried

l-Leucine modified voriconazole spray dried micropartcles.

Using Atomic Force Microscopy to Retrieve Nanomechanical Surface Properties of Materials

2006 ◽  
Vol 514-516 ◽  
pp. 1598-1602 ◽  
Author(s):  
Sergio Graça ◽  
Rogerio Colaço ◽  
Rui Vilar
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Properties ◽  
Application Rate ◽  
Critical Parameters ◽  
Nanomechanical Property ◽  
Force Microscopy ◽  
Atomic Force ◽  
Properties Of Materials ◽  
Microscopy Techniques ◽  
Scratch Tests

When atomic force microscopy is used to retrieve nanomechanical surface properties of materials, unsuspected measurement and instrumentation errors may occur. In this work, some error sources are investigated and operating and correction procedures are proposed in order to maximize the accuracy of the measurements. Experiments were performed on sapphire, Ni, Co and Ni-30%Co samples. A triangular pyramidal diamond tip was used to perform indentation and scratch tests, as well as for surface visualization. It was found that nonlinearities of the z-piezo scanner, in particular the creep of the z-piezo, and errors in the determination of the real dimensions of tested areas, are critical parameters to be considered. However, it was observed that there is a critical load application rate, above which the influence of the creep of the z-piezo can be neglected. Also, it was observed that deconvolution of the tip geometry from the image of the tested area is essential to obtain accurate values of the dimensions of indentations and scratches. The application of these procedures enables minimizing the errors in nanomechanical property measurements using atomic force microscopy techniques.

Atomic force microscopy studies of microstructure and properties of self-assembled monolayers

1996 ◽  
Vol 54 ◽  
pp. 864-865
Author(s):  
J. F. Richards ◽  
E. B. Troughton ◽  
R. A. Dennis ◽  
P. E. Russell
Keyword(s):  
Atomic Force Microscopy ◽  
Single Crystal ◽  
Level Structure ◽  
Polymeric Materials ◽  
Self Assembled Monolayers ◽  
Force Microscopy ◽  
Microstructure And Properties ◽  
Atomic Force ◽  
Assembled Monolayers ◽  
Self Assembled

Self-assembled monolayers are unique structures and have received considerable attention from microscopists seeking to image the predicted molecular level structure. More recently, practical engineering applications of SAMs have been proposed in areas ranging from corrosion barriers to adhesion promoters to lithographic resists. While some of the applications of interest, most notably the lithographic resists, can be developed on substrates close to the ideal; such as single crystal Si wafers or thin epitaxial films; many others will require the coating of very non-ideal surfaces. These may range from materials such as Al or ferrous based metals to engineering polymeric materials. In this study we have taken a two-pronged approach to develop reliable systematic atomic force microscopy (AFM) techniques for the determination of both microstructure and properties of SAMs on various substrates of interest.We have chosen to investigate n-alkanethiols (SH-(CH2)n-1-CH3) on single crystal gold as our reference system for technique development.

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