Atomic force microscopy analysis of cleaved facets in III-nitride laser diodes grown on free-standing GaN substrates

Free Standing ◽

Force Microscopy ◽

Atomic Force ◽

Cleaved Facets ◽

Microscopy Analysis ◽

Nitride Laser

Conducting tip atomic force microscopy analysis of aluminum oxide barrier defects decorated by electrodeposition

Applied Physics Letters ◽

10.1063/1.1415775 ◽

2001 ◽

Vol 79 (19) ◽

pp. 3158-3160 ◽

Cited By ~ 3

Author(s):

J. Carrey ◽

K. Bouzehouane ◽

J.-M. George ◽

C. Ceneray ◽

A. Fert ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Aluminum Oxide ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Analysis ◽

Oxide Barrier

Atomic force microscopy analysis of wool fibre surfaces in air and under water

Micron ◽

10.1016/s0968-4328(99)00076-1 ◽

2000 ◽

Vol 31 (6) ◽

pp. 659-667 ◽

Cited By ~ 24

Author(s):

J.A.A. Crossley ◽

C.T. Gibson ◽

L.D. Mapledoram ◽

M.G. Huson ◽

S. Myhra ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Wool Fibre ◽

Force Microscopy ◽

Atomic Force ◽

Corrigendum: Atomic force microscopy analysis of surface topography of pure thin aluminum films (2018 Mater. Res. Express 5 046416 )

Materials Research Express ◽

10.1088/2053-1591/ab2f97 ◽

2019 ◽

Author(s):

Fredrick Madaraka Mwema ◽

Oluseyi Philip Oladijo ◽

Stephen Satheraj ◽

Esther Akinlabi

Keyword(s):

Atomic Force Microscopy ◽

Surface Topography ◽

Aluminum Films ◽

Force Microscopy ◽

Atomic Force ◽

Thin Aluminum ◽

Atomic force microscopy analysis of the effect of plasma treatment on gas permeable contact lens surface topography

Contact Lens and Anterior Eye ◽

10.1016/j.clae.2019.02.010 ◽

2019 ◽

Vol 42 (3) ◽

pp. 265-272 ◽

Cited By ~ 1

Author(s):

Felicity R. Gill ◽

Christine Purslow ◽

Paul J. Murphy

Keyword(s):

Atomic Force Microscopy ◽

Plasma Treatment ◽

Surface Topography ◽

Contact Lens ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Analysis ◽

Lens Surface

An atomic force microscopy analysis of yeast mutants defective in cell wall architecture

Yeast ◽

10.1002/yea.1801 ◽

2010 ◽

Vol 27 (8) ◽

pp. 673-684 ◽

Cited By ~ 48

Author(s):

Etienne Dague ◽

Rajaa Bitar ◽

Hubert Ranchon ◽

Fabien Durand ◽

Hélène Martin Yken ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Cell Wall ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Analysis ◽

Yeast Mutants ◽

Cell Wall Architecture

ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) ◽

Atomic force microscopy analysis of Ga-face and N-face GaN grown on Al/sub 2/O/sub 3/ (0001) by plasma-assisted molecular beam epitaxy

10.1109/asdam.2000.889519 ◽

2002 ◽

Author(s):

A. Kostopoulos ◽

S. Mikroulis ◽

E. Dimakis ◽

K. Tsagaraki ◽

G. Constantinidis ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Molecular Beam Epitaxy ◽

Molecular Beam ◽

Force Microscopy ◽

Atomic Force ◽

X-ray diffraction and atomic force microscopy analysis of twinned crystals: rhombohedral canavalin

Acta Crystallographica Section D Biological Crystallography ◽

10.1107/s0907444901003791 ◽

2001 ◽

Vol 57 (6) ◽

pp. 829-839 ◽

Cited By ~ 16

Author(s):

Tzu-Ping Ko ◽

Yurii G. Kuznetsov ◽

Alexander J. Malkin ◽

John Day ◽

Alexander McPherson

Keyword(s):

Atomic Force Microscopy ◽

X Ray Diffraction ◽

X Ray ◽

Force Microscopy ◽

Atomic Force ◽

Atomic Force Microscopy Analysis of Bacterial Surface Morphology Before and After Cell Washing

Journal of Scanning Probe Microscopy ◽

10.1166/jspm.2006.007 ◽

2006 ◽

Vol 1 (2) ◽

pp. 63-73 ◽

Cited By ~ 4

Author(s):

A. M. Gallardo-Moreno ◽

Y. Liu ◽

M. L. González-Martín ◽

T. A. Camesano

Keyword(s):

Atomic Force Microscopy ◽

Surface Morphology ◽

Bacterial Surface ◽

Force Microscopy ◽

Atomic Force ◽

Before And After ◽

Atomic Force Microscopy Analysis of Deformation of Single Cytochrome CYP102A1 Molecules

Science of Advanced Materials ◽

10.1166/sam.2017.2947 ◽

2017 ◽

Vol 9 (1) ◽

pp. 135-143 ◽

Cited By ~ 1

Author(s):

N. S. Bukharina ◽

T. O. Pleshakova ◽

V. S. Ziborov ◽

D. A. Fokin ◽

N. D. Ivanova ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Atomic force microscopy analysis of orientation effect on InP-based heterojunction bipolar transistors

2007 ICTON Mediterranean Winter Conference ◽

10.1109/ictonmw.2007.4446981 ◽

2007 ◽

Author(s):

D. Sachelarie ◽

S.G. Stanciu ◽

G.A. Stanciu

Keyword(s):

Atomic Force Microscopy ◽

Heterojunction Bipolar Transistors ◽

Bipolar Transistors ◽

Orientation Effect ◽

Force Microscopy ◽

Atomic Force ◽