Interface dipole and effective work function of Re in Re∕HfO2∕SiOx∕n-Si gate stack
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2004 ◽
Vol 25
(3)
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pp. 123-125
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2015 ◽
Vol 62
(12)
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pp. 3987-3991
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2007 ◽
Vol 28
(12)
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pp. 1089-1091
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