Atomic layer deposition of insulating nitride interfacial layers for germanium metal oxide semiconductor field effect transistors with high-κ oxide/tungsten nitride gate stacks

2007 ◽  
Vol 90 (21) ◽  
pp. 212104 ◽  
Author(s):  
Kyoung H. Kim ◽  
Roy G. Gordon ◽  
Andrew Ritenour ◽  
Dimitri A. Antoniadis
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