Atomic layer deposition of insulating nitride interfacial layers for germanium metal oxide semiconductor field effect transistors with high-κ oxide/tungsten nitride gate stacks
2009 ◽
Vol 48
(4)
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pp. 04C009
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2004 ◽
Vol 33
(8)
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pp. 912-915
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2011 ◽
Vol 14
(5)
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pp. G27
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2018 ◽
Vol 461
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pp. 255-259
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2017 ◽
Vol 32
(4)
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pp. 045018
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