scholarly journals Temperature-dependent transition from injection-limited to space-charge-limited current in metal-organic diodes

2009 ◽  
Vol 95 (14) ◽  
pp. 143303 ◽  
Author(s):  
Yi Zheng ◽  
Andrew T. S. Wee ◽  
Cedric Troadec ◽  
N. Chandrasekhar
2017 ◽  
Vol 8 ◽  
pp. 1277-1282 ◽  
Author(s):  
Vineeth Kumar Bandari ◽  
Lakshmi Varadharajan ◽  
Longqian Xu ◽  
Abdur Rehman Jalil ◽  
Mirunalini Devarajulu ◽  
...  

The investigation of charge transport in organic nanocrystals is essential to understand nanoscale physical properties of organic systems and the development of novel organic nanodevices. In this work, we fabricate organic nanocrystal diodes contacted by rolled-up robust nanomembranes. The organic nanocrystals consist of vanadyl phthalocyanine and copper hexadecafluorophthalocyanine heterojunctions. The temperature dependent charge transport through organic nanocrystals was investigated to reveal the transport properties of ohmic and space-charge-limited current under different conditions, for instance, temperature and bias.


1966 ◽  
Vol 2 (7) ◽  
pp. 282
Author(s):  
A.M. Phahle ◽  
K.C. Kao ◽  
J.H. Calderwood

1995 ◽  
Vol 377 ◽  
Author(s):  
G. J. Adriaenssens ◽  
B. Yan ◽  
A. Eliat

ABSTRACTA full and detailed transient space-charge-limited current (T-SCLC) study of a-Si:H p-i-n diodes has been carried out in the time range from 108s to 10s. In the short-time regime, general features of T-SCLC such as the current cusp and the carrier extraction period were observed, and related transport parameters were deduced. Electron emission from deep states was studied by measuring the current transients well beyond the extraction time. The emission time is thermally activated at temperatures higher than 250K and levels off at lower temperatures. The high temperature behaviour places the upper edge of the deep states at 0.42–0.52eV below the conduction band edge, and the attempt-to-escape frequency in the range of 1011-1013Hz. An observed shift of emission time with light intensity is attributed to defect relaxation.


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