Analysis of degradation mechanisms in lattice-matched InAlN/GaN high-electron-mobility transistors

2009 ◽  
Vol 106 (12) ◽  
pp. 124503 ◽  
Author(s):  
J. Kuzmik ◽  
G. Pozzovivo ◽  
C. Ostermaier ◽  
G. Strasser ◽  
D. Pogany ◽  
...  
1999 ◽  
Vol 38 (Part 2, No. 2B) ◽  
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Tetsuya Suemitsu ◽  
Tetsuyoshi Ishii ◽  
Haruki Yokoyama ◽  
Takatomo Enoki ◽  
Yasunobu Ishii ◽  
...  

2011 ◽  
Vol 17 (S2) ◽  
pp. 1354-1355
Author(s):  
L Zhou ◽  
L Kirste ◽  
T Lim ◽  
R Aidam ◽  
O Ambacher ◽  
...  

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.


2000 ◽  
Vol 39 (Part 2, No. 8B) ◽  
pp. L838-L840 ◽  
Author(s):  
Yoshimi Yamashita ◽  
Akira Endoh ◽  
Masataka Higashiwaki ◽  
Kohki Hikosaka ◽  
Takashi Mimura ◽  
...  

2002 ◽  
Vol 41 (Part 2, No. 4B) ◽  
pp. L437-L439 ◽  
Author(s):  
Keisuke Shinohara ◽  
Yoshimi Yamashita ◽  
Akira Endoh ◽  
Kohki Hikosaka ◽  
Toshiaki Matsui ◽  
...  

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