2007 IEEE International Electron Devices Meeting
Latest Publications

TOTAL DOCUMENTS

281
(FIVE YEARS 0)

H-INDEX

31
(FIVE YEARS 0)

Published By IEEE

9781424415076
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Interface-Engineered Ge (100) and (111), N- and P-FETs with High Mobility

2007 ◽  
Author(s):  
Duygu Kuzum ◽  
Abhijit J. Pethe ◽  
Tejas Krishnamohan ◽  
Yasuhiro Oshima ◽  
Yun Sun ◽  
...  
Keyword(s):  
High Mobility

SiGe BiCMOS Technology with 3.0 ps Gate Delay

2007 ◽  
Author(s):  
H. Rucker ◽  
O. Fursenko ◽  
T. Grabolla ◽  
U. Haak ◽  
W. Hoppner ◽  
...  
Keyword(s):  
Gate Delay ◽  
Bicmos Technology ◽  
Sige Bicmos

Trap Layer Engineered Gate-All-Around Vertically Stacked Twin Si -Nanowire Nonvolatile Memory

2007 ◽  
Author(s):  
J. Fu ◽  
K. D. Buddharaju ◽  
S. H. G. Teo ◽  
Chunxiang Zhu ◽  
M. B. Yu ◽  
...  
Keyword(s):  
Nonvolatile Memory ◽  
Si Nanowire

Electrical measurement of adhesion and viability of living cells with a silicon chip

2007 ◽  
Author(s):  
L. Bandiera ◽  
M. Borgo ◽  
G. Cellere ◽  
A. De Toni ◽  
L. Santoni ◽  
...  
Keyword(s):  
Electrical Measurement ◽  
Living Cells

Integration Technology of PC-FUSI (Phase Controlled FUSI) / HfSiON Gate Stack for Embedded Memory Application

2007 ◽  
Author(s):  
Motofumi Saitoh ◽  
Takashi Ogura ◽  
Koji Masuzaki ◽  
Kensuke Takahashi ◽  
Hiroshi Sunamura ◽  
...  
Keyword(s):  
Embedded Memory ◽  
Gate Stack ◽  
Integration Technology

Ultra-Low Leakage Silicon-on-Insulator Technology for 65 nm Node and Beyond

2007 ◽  
Author(s):  
Jin Cai ◽  
Amlan Majumdar ◽  
David Dobuzinsky ◽  
Tak H. Ning ◽  
Steven J. Koester ◽  
...  
Keyword(s):  
Silicon On Insulator ◽  
Low Leakage ◽  
Silicon On Insulator Technology
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